Power Spectral Density Analysis for Optimizing SERS Structures

The problem of optimizing the topography of metal structures allowing Surface Enhanced Raman Scattering (SERS) sensing is considered. We developed a model, which randomly distributes hemispheroidal particles over a given area of the glass substrate and estimates SERS capabilities of the obtained structures. We applied Power Spectral Density (PSD) analysis to modeled structures and to atomic force microscope images widely used in SERS metal island films and metal dendrites. The comparison of measured and calculated SERS signals from differing characteristics structures with the results of PSD analysis of these structures has shown that this approach allows simple identification and choosing a structure topography, which is capable of providing the maximal enhancement of Raman signal within a given set of structures of the same type placed on the substrate.