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Thermal oxidation process on Si(113)-(3 × 2) investigated using high-temperature scanning tunneling microscopy

Thermal oxidation of Si(113) in a monolayer regime was investigated using high-temperature scanning tunneling microscopy (STM). Dynamic processes during thermal oxidation were examined in three oxidation modes – oxidation, etching, and transition modes – in the third of which both oxidation and etch...

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Detalles Bibliográficos
Autores principales: Tanaka, Hiroya, Ohno, Shinya, Miki, Kazushi, Tanaka, Masatoshi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8822459/
https://www.ncbi.nlm.nih.gov/pubmed/35186651
http://dx.doi.org/10.3762/bjnano.13.12