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Compton coincidence in silicon photon-counting CT detectors

PURPOSE: Compton interactions amount to a significant fraction of the registered counts in a silicon detector. In a Compton interaction, only a part of the photon energy is deposited and a single incident photon can result in multiple counts unless tungsten shielding is used. Deep silicon has proved...

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Autores principales: Sundberg, Christel, Danielsson, Mats, Persson, Mats
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Society of Photo-Optical Instrumentation Engineers 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8823694/
https://www.ncbi.nlm.nih.gov/pubmed/35155716
http://dx.doi.org/10.1117/1.JMI.9.1.013501
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author Sundberg, Christel
Danielsson, Mats
Persson, Mats
author_facet Sundberg, Christel
Danielsson, Mats
Persson, Mats
author_sort Sundberg, Christel
collection PubMed
description PURPOSE: Compton interactions amount to a significant fraction of the registered counts in a silicon detector. In a Compton interaction, only a part of the photon energy is deposited and a single incident photon can result in multiple counts unless tungsten shielding is used. Deep silicon has proved to be a competitive material for photon-counting CT detectors, but to improve the performance further, one possibility is to use coincidence techniques to identify Compton-scattered photons and reconstruct their incident energies. APPROACH: In a detector with no tungsten shielding, incident photons can interact through a series of interactions. Based on the position and energy of each interaction, probability-based methods can be used to estimate the incident photon energy. Here, we present a maximum likelihood estimation framework along with an alternative method to estimate the incident photon energy and position in a silicon detector. RESULTS: Assuming one incident photon per time frame, we show that the incident photon energy can be estimated with a mean error of [Formula: see text] and an RMS error of [Formula: see text] for a realistic case in which we assume a detector with limited energy and spatial resolution. The interaction position was estimated with a mean error of [Formula: see text] in [Formula: see text] direction and [Formula: see text] in [Formula: see text] direction. Corresponding RMS errors of [Formula: see text] and [Formula: see text] were achieved in [Formula: see text] and [Formula: see text] , respectively. CONCLUSIONS: The presented results show the potential of using probability-based methods to improve the performance of silicon detectors for CT.
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spelling pubmed-88236942023-02-08 Compton coincidence in silicon photon-counting CT detectors Sundberg, Christel Danielsson, Mats Persson, Mats J Med Imaging (Bellingham) Physics of Medical Imaging PURPOSE: Compton interactions amount to a significant fraction of the registered counts in a silicon detector. In a Compton interaction, only a part of the photon energy is deposited and a single incident photon can result in multiple counts unless tungsten shielding is used. Deep silicon has proved to be a competitive material for photon-counting CT detectors, but to improve the performance further, one possibility is to use coincidence techniques to identify Compton-scattered photons and reconstruct their incident energies. APPROACH: In a detector with no tungsten shielding, incident photons can interact through a series of interactions. Based on the position and energy of each interaction, probability-based methods can be used to estimate the incident photon energy. Here, we present a maximum likelihood estimation framework along with an alternative method to estimate the incident photon energy and position in a silicon detector. RESULTS: Assuming one incident photon per time frame, we show that the incident photon energy can be estimated with a mean error of [Formula: see text] and an RMS error of [Formula: see text] for a realistic case in which we assume a detector with limited energy and spatial resolution. The interaction position was estimated with a mean error of [Formula: see text] in [Formula: see text] direction and [Formula: see text] in [Formula: see text] direction. Corresponding RMS errors of [Formula: see text] and [Formula: see text] were achieved in [Formula: see text] and [Formula: see text] , respectively. CONCLUSIONS: The presented results show the potential of using probability-based methods to improve the performance of silicon detectors for CT. Society of Photo-Optical Instrumentation Engineers 2022-02-08 2022-01 /pmc/articles/PMC8823694/ /pubmed/35155716 http://dx.doi.org/10.1117/1.JMI.9.1.013501 Text en © 2022 The Authors https://creativecommons.org/licenses/by/4.0/Published by SPIE under a Creative Commons Attribution 4.0 International License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.
spellingShingle Physics of Medical Imaging
Sundberg, Christel
Danielsson, Mats
Persson, Mats
Compton coincidence in silicon photon-counting CT detectors
title Compton coincidence in silicon photon-counting CT detectors
title_full Compton coincidence in silicon photon-counting CT detectors
title_fullStr Compton coincidence in silicon photon-counting CT detectors
title_full_unstemmed Compton coincidence in silicon photon-counting CT detectors
title_short Compton coincidence in silicon photon-counting CT detectors
title_sort compton coincidence in silicon photon-counting ct detectors
topic Physics of Medical Imaging
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8823694/
https://www.ncbi.nlm.nih.gov/pubmed/35155716
http://dx.doi.org/10.1117/1.JMI.9.1.013501
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