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Degradation Study of Thin-Film Silicon Structures in a Cell Culture Medium

Thin-film silicon (Si)-based transient electronics represents an emerging technology that enables spontaneous dissolution, absorption and, finally, physical disappearance in a controlled manner under physiological conditions, and has attracted increasing attention in pertinent clinical applications...

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Detalles Bibliográficos
Autores principales: Wang, Huachun, Tian, Jingjing, Lu, Bingwei, Xie, Yang, Sun, Pengcheng, Yin, Lan, Wang, Yuguang, Sheng, Xing
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8838160/
https://www.ncbi.nlm.nih.gov/pubmed/35161547
http://dx.doi.org/10.3390/s22030802
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author Wang, Huachun
Tian, Jingjing
Lu, Bingwei
Xie, Yang
Sun, Pengcheng
Yin, Lan
Wang, Yuguang
Sheng, Xing
author_facet Wang, Huachun
Tian, Jingjing
Lu, Bingwei
Xie, Yang
Sun, Pengcheng
Yin, Lan
Wang, Yuguang
Sheng, Xing
author_sort Wang, Huachun
collection PubMed
description Thin-film silicon (Si)-based transient electronics represents an emerging technology that enables spontaneous dissolution, absorption and, finally, physical disappearance in a controlled manner under physiological conditions, and has attracted increasing attention in pertinent clinical applications such as biomedical implants for on-body sensing, disease diagnostics, and therapeutics. The degradation behavior of thin-film Si materials and devices is critically dependent on the device structure as well as the environment. In this work, we experimentally investigated the dissolution of planar Si thin films and micropatterned Si pillar arrays in a cell culture medium, and systematically analyzed the evolution of their topographical, physical, and chemical properties during the hydrolysis. We discovered that the cell culture medium significantly accelerates the degradation process, and Si pillar arrays present more prominent degradation effects by creating rougher surfaces, complicating surface states, and decreasing the electrochemical impedance. Additionally, the dissolution process leads to greatly reduced mechanical strength. Finally, in vitro cell culture studies demonstrate desirable biocompatibility of corroded Si pillars. The results provide a guideline for the use of thin-film Si materials and devices as transient implants in biomedicine.
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spelling pubmed-88381602022-02-13 Degradation Study of Thin-Film Silicon Structures in a Cell Culture Medium Wang, Huachun Tian, Jingjing Lu, Bingwei Xie, Yang Sun, Pengcheng Yin, Lan Wang, Yuguang Sheng, Xing Sensors (Basel) Article Thin-film silicon (Si)-based transient electronics represents an emerging technology that enables spontaneous dissolution, absorption and, finally, physical disappearance in a controlled manner under physiological conditions, and has attracted increasing attention in pertinent clinical applications such as biomedical implants for on-body sensing, disease diagnostics, and therapeutics. The degradation behavior of thin-film Si materials and devices is critically dependent on the device structure as well as the environment. In this work, we experimentally investigated the dissolution of planar Si thin films and micropatterned Si pillar arrays in a cell culture medium, and systematically analyzed the evolution of their topographical, physical, and chemical properties during the hydrolysis. We discovered that the cell culture medium significantly accelerates the degradation process, and Si pillar arrays present more prominent degradation effects by creating rougher surfaces, complicating surface states, and decreasing the electrochemical impedance. Additionally, the dissolution process leads to greatly reduced mechanical strength. Finally, in vitro cell culture studies demonstrate desirable biocompatibility of corroded Si pillars. The results provide a guideline for the use of thin-film Si materials and devices as transient implants in biomedicine. MDPI 2022-01-21 /pmc/articles/PMC8838160/ /pubmed/35161547 http://dx.doi.org/10.3390/s22030802 Text en © 2022 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Wang, Huachun
Tian, Jingjing
Lu, Bingwei
Xie, Yang
Sun, Pengcheng
Yin, Lan
Wang, Yuguang
Sheng, Xing
Degradation Study of Thin-Film Silicon Structures in a Cell Culture Medium
title Degradation Study of Thin-Film Silicon Structures in a Cell Culture Medium
title_full Degradation Study of Thin-Film Silicon Structures in a Cell Culture Medium
title_fullStr Degradation Study of Thin-Film Silicon Structures in a Cell Culture Medium
title_full_unstemmed Degradation Study of Thin-Film Silicon Structures in a Cell Culture Medium
title_short Degradation Study of Thin-Film Silicon Structures in a Cell Culture Medium
title_sort degradation study of thin-film silicon structures in a cell culture medium
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8838160/
https://www.ncbi.nlm.nih.gov/pubmed/35161547
http://dx.doi.org/10.3390/s22030802
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