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Fully Electrical Post-Fabrication Trimming of Resistive Sensors

A compact and efficient IC architecture is presented as an alternative to laser-trimmed precision thin-film resistors or look-up tables. The objective is to keep the device, such as a four-terminal Wheatstone bridge, but to compensate for post-manufacturing offset and to avoid the so-induced degrada...

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Autores principales: Shankhour, Ibrahim, Mohdad, Jad, Mailly, Frédérick, Nouet, Pascal
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8839992/
https://www.ncbi.nlm.nih.gov/pubmed/35161514
http://dx.doi.org/10.3390/s22030767
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author Shankhour, Ibrahim
Mohdad, Jad
Mailly, Frédérick
Nouet, Pascal
author_facet Shankhour, Ibrahim
Mohdad, Jad
Mailly, Frédérick
Nouet, Pascal
author_sort Shankhour, Ibrahim
collection PubMed
description A compact and efficient IC architecture is presented as an alternative to laser-trimmed precision thin-film resistors or look-up tables. The objective is to keep the device, such as a four-terminal Wheatstone bridge, but to compensate for post-manufacturing offset and to avoid the so-induced degradation of performances in terms of full-scale, non-linearity, power supply noise rejection and scale factor. Expected advantages are a reduced cost due to the electrical-only implementation and a possible on-field calibration of high-end sensors. Application of the proposed solution is illustrated on an example to demonstrate improvement factors on offset and sensitivity accuracy of 32 and 10, respectively. Additionally, the power supply rejection ratio is improved by 30 dB. The experimental results finally demonstrate both efficiency and versatility of the proposed solution thanks to a first silicon prototype, fabricated in a 0.35 μm Technology from AMS, connected to an off-the-shelf pressure sensor.
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spelling pubmed-88399922022-02-13 Fully Electrical Post-Fabrication Trimming of Resistive Sensors Shankhour, Ibrahim Mohdad, Jad Mailly, Frédérick Nouet, Pascal Sensors (Basel) Article A compact and efficient IC architecture is presented as an alternative to laser-trimmed precision thin-film resistors or look-up tables. The objective is to keep the device, such as a four-terminal Wheatstone bridge, but to compensate for post-manufacturing offset and to avoid the so-induced degradation of performances in terms of full-scale, non-linearity, power supply noise rejection and scale factor. Expected advantages are a reduced cost due to the electrical-only implementation and a possible on-field calibration of high-end sensors. Application of the proposed solution is illustrated on an example to demonstrate improvement factors on offset and sensitivity accuracy of 32 and 10, respectively. Additionally, the power supply rejection ratio is improved by 30 dB. The experimental results finally demonstrate both efficiency and versatility of the proposed solution thanks to a first silicon prototype, fabricated in a 0.35 μm Technology from AMS, connected to an off-the-shelf pressure sensor. MDPI 2022-01-20 /pmc/articles/PMC8839992/ /pubmed/35161514 http://dx.doi.org/10.3390/s22030767 Text en © 2022 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Shankhour, Ibrahim
Mohdad, Jad
Mailly, Frédérick
Nouet, Pascal
Fully Electrical Post-Fabrication Trimming of Resistive Sensors
title Fully Electrical Post-Fabrication Trimming of Resistive Sensors
title_full Fully Electrical Post-Fabrication Trimming of Resistive Sensors
title_fullStr Fully Electrical Post-Fabrication Trimming of Resistive Sensors
title_full_unstemmed Fully Electrical Post-Fabrication Trimming of Resistive Sensors
title_short Fully Electrical Post-Fabrication Trimming of Resistive Sensors
title_sort fully electrical post-fabrication trimming of resistive sensors
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8839992/
https://www.ncbi.nlm.nih.gov/pubmed/35161514
http://dx.doi.org/10.3390/s22030767
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