Cargando…
Deep learning in optical metrology: a review
With the advances in scientific foundations and technological implementations, optical metrology has become versatile problem-solving backbones in manufacturing, fundamental research, and engineering applications, such as quality control, nondestructive testing, experimental mechanics, and biomedici...
Autores principales: | Zuo, Chao, Qian, Jiaming, Feng, Shijie, Yin, Wei, Li, Yixuan, Fan, Pengfei, Han, Jing, Qian, Kemao, Chen, Qian |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2022
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8866517/ https://www.ncbi.nlm.nih.gov/pubmed/35197457 http://dx.doi.org/10.1038/s41377-022-00714-x |
Ejemplares similares
-
Correction: Deep learning in optical metrology: a review
por: Zuo, Chao, et al.
Publicado: (2022) -
Deep Learning-Based 3D Measurements with Near-Infrared Fringe Projection
por: Wang, Jinglei, et al.
Publicado: (2022) -
Optical metrology embraces deep learning: keeping an open mind
por: Pan, Bing
Publicado: (2022) -
Temporal phase unwrapping using deep learning
por: Yin, Wei, et al.
Publicado: (2019) -
Optical metrology
por: Gasvik, Kjell J
Publicado: (1995)