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Improved spin–orbit torque induced magnetization switching efficiency by helium ion irradiation
Increasing the efficiency of spin–orbit torque (SOT) is of great interest in spintronics devices because of its application to the non-volatile magnetic random access memory and in-logic memory devices. Accordingly, there are several studies to alter the magnetic properties and reduce the SOT switch...
Autores principales: | , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8891290/ https://www.ncbi.nlm.nih.gov/pubmed/35236883 http://dx.doi.org/10.1038/s41598-022-06960-8 |
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author | An, Suhyeok Baek, Eunchong Kim, Jin-A Lee, Ki-Seung You, Chun-Yeol |
author_facet | An, Suhyeok Baek, Eunchong Kim, Jin-A Lee, Ki-Seung You, Chun-Yeol |
author_sort | An, Suhyeok |
collection | PubMed |
description | Increasing the efficiency of spin–orbit torque (SOT) is of great interest in spintronics devices because of its application to the non-volatile magnetic random access memory and in-logic memory devices. Accordingly, there are several studies to alter the magnetic properties and reduce the SOT switching current with helium ion irradiation, but previous researches are focused on its phenomenological changes only. Here, the authors observe the reduction of switching current and analyze its origins. The analyzed major reasons are improved spin Hall angle represented as the changed resistivity of heavy metal layer and the reduction of surface anisotropy energy at interface between heavy metal and ferromagnet. It is confirmed that almost linear relation between changed SHA and Pt resistivity by helium ion irradiation, which is attributed because of the increase in the scattering sources induced by structural distortion during ion penetration. From the calculated power consumption ratio based on the derived parameter, the requiring power decreases according to the degree of ion irradiation. Our results show that helium ion penetration induced layer and interfacial disturbance affects SOT induced magnetization switching current reduction and may provide possibility about helium ion irradiation based superior SOT device engineering. |
format | Online Article Text |
id | pubmed-8891290 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2022 |
publisher | Nature Publishing Group UK |
record_format | MEDLINE/PubMed |
spelling | pubmed-88912902022-03-03 Improved spin–orbit torque induced magnetization switching efficiency by helium ion irradiation An, Suhyeok Baek, Eunchong Kim, Jin-A Lee, Ki-Seung You, Chun-Yeol Sci Rep Article Increasing the efficiency of spin–orbit torque (SOT) is of great interest in spintronics devices because of its application to the non-volatile magnetic random access memory and in-logic memory devices. Accordingly, there are several studies to alter the magnetic properties and reduce the SOT switching current with helium ion irradiation, but previous researches are focused on its phenomenological changes only. Here, the authors observe the reduction of switching current and analyze its origins. The analyzed major reasons are improved spin Hall angle represented as the changed resistivity of heavy metal layer and the reduction of surface anisotropy energy at interface between heavy metal and ferromagnet. It is confirmed that almost linear relation between changed SHA and Pt resistivity by helium ion irradiation, which is attributed because of the increase in the scattering sources induced by structural distortion during ion penetration. From the calculated power consumption ratio based on the derived parameter, the requiring power decreases according to the degree of ion irradiation. Our results show that helium ion penetration induced layer and interfacial disturbance affects SOT induced magnetization switching current reduction and may provide possibility about helium ion irradiation based superior SOT device engineering. Nature Publishing Group UK 2022-03-02 /pmc/articles/PMC8891290/ /pubmed/35236883 http://dx.doi.org/10.1038/s41598-022-06960-8 Text en © The Author(s) 2022 https://creativecommons.org/licenses/by/4.0/Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. The images or other third party material in this article are included in the article's Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article's Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/ (https://creativecommons.org/licenses/by/4.0/) . |
spellingShingle | Article An, Suhyeok Baek, Eunchong Kim, Jin-A Lee, Ki-Seung You, Chun-Yeol Improved spin–orbit torque induced magnetization switching efficiency by helium ion irradiation |
title | Improved spin–orbit torque induced magnetization switching efficiency by helium ion irradiation |
title_full | Improved spin–orbit torque induced magnetization switching efficiency by helium ion irradiation |
title_fullStr | Improved spin–orbit torque induced magnetization switching efficiency by helium ion irradiation |
title_full_unstemmed | Improved spin–orbit torque induced magnetization switching efficiency by helium ion irradiation |
title_short | Improved spin–orbit torque induced magnetization switching efficiency by helium ion irradiation |
title_sort | improved spin–orbit torque induced magnetization switching efficiency by helium ion irradiation |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8891290/ https://www.ncbi.nlm.nih.gov/pubmed/35236883 http://dx.doi.org/10.1038/s41598-022-06960-8 |
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