Sifting fluctuation scattering from microtextured samples

As the relationship of texture and microtexture to fluctuation X-ray scattering (FXS) has been clarified in detail, key progress is expected in the exploitation of FXS-based structural investigation of matter exhibiting complex order.

Detalles Bibliográficos
Autor principal: Cervellino, Antonio
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2022
Materias:
Scientific Commentaries
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8895018/
https://www.ncbi.nlm.nih.gov/pubmed/35371511
http://dx.doi.org/10.1107/S2052252522002044
Descripción
Sumario:As the relationship of texture and microtexture to fluctuation X-ray scattering (FXS) has been clarified in detail, key progress is expected in the exploitation of FXS-based structural investigation of matter exhibiting complex order.

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