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Sifting fluctuation scattering from microtextured samples
As the relationship of texture and microtexture to fluctuation X-ray scattering (FXS) has been clarified in detail, key progress is expected in the exploitation of FXS-based structural investigation of matter exhibiting complex order.
Autor principal: | Cervellino, Antonio |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8895018/ https://www.ncbi.nlm.nih.gov/pubmed/35371511 http://dx.doi.org/10.1107/S2052252522002044 |
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