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Corn Seed Defect Detection Based on Watershed Algorithm and Two-Pathway Convolutional Neural Networks

Corn seed materials of different quality were imaged, and a method for defect detection was developed based on a watershed algorithm combined with a two-pathway convolutional neural network (CNN) model. In this study, RGB and near-infrared (NIR) images were acquired with a multispectral camera to tr...

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Detalles Bibliográficos
Autores principales: Wang, Linbai, Liu, Jingyan, Zhang, Jun, Wang, Jing, Fan, Xiaofei
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Frontiers Media S.A. 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8905238/
https://www.ncbi.nlm.nih.gov/pubmed/35283875
http://dx.doi.org/10.3389/fpls.2022.730190