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Corn Seed Defect Detection Based on Watershed Algorithm and Two-Pathway Convolutional Neural Networks
Corn seed materials of different quality were imaged, and a method for defect detection was developed based on a watershed algorithm combined with a two-pathway convolutional neural network (CNN) model. In this study, RGB and near-infrared (NIR) images were acquired with a multispectral camera to tr...
Autores principales: | , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Frontiers Media S.A.
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8905238/ https://www.ncbi.nlm.nih.gov/pubmed/35283875 http://dx.doi.org/10.3389/fpls.2022.730190 |