Crystallography and Microstructure of 7M Martensite in Ni-Mn-Ga Thin Films Epitaxially Grown on (1 1 [Formula: see text] 0)-Oriented Al(2)O(3) Substrate

Epitaxial Ni-Mn-Ga thin films have been extensively investigated, due to their potential applications in magnetic micro-electro-mechanical systems. It has been proposed that the martensitic phase in the <1 1 0>(A)-oriented film is much more stable than that in the <1 0 0>(A)-oriented film. Nevertheless, the magnetic properties, microstructural features, and crystal structures of martensite in such films have not been fully revealed. In this work, the <1 1 0>(A)-oriented Ni(51.0)Mn(27.5)Ga(21.5) films with different thicknesses were prepared by epitaxially growing on Al(2)O(3)(1 1 [Formula: see text] 0) substrate by magnetron sputtering. The characterization by X-ray diffraction technique and transmission electron microscopy revealed that all the Ni(51.0)Mn(27.5)Ga(21.5) films are of 7M martensite at the ambient temperature, with their Type-I and Type-II twinning interfaces nearly parallel to the substrate surface.