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Genome-Wide Association Mapping Indicates Quantitative Genetic Control of Spot Blotch Resistance in Bread Wheat and the Favorable Effects of Some Spot Blotch Loci on Grain Yield

Spot blotch caused by the fungus Bipolaris sorokiniana poses a serious threat to bread wheat production in warm and humid wheat-growing regions of the world. Hence, the major objective of this study was to identify consistent genotyping-by-sequencing (GBS) markers associated with spot blotch resista...

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Autores principales: Juliana, Philomin, He, Xinyao, Poland, Jesse, Shrestha, Sandesh, Joshi, Arun K., Huerta-Espino, Julio, Govindan, Velu, Crespo-Herrera, Leonardo Abdiel, Mondal, Suchismita, Kumar, Uttam, Bhati, Pradeep K., Vishwakarma, Manish, Singh, Ravi P., Singh, Pawan K.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Frontiers Media S.A. 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8928540/
https://www.ncbi.nlm.nih.gov/pubmed/35310648
http://dx.doi.org/10.3389/fpls.2022.835095
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author Juliana, Philomin
He, Xinyao
Poland, Jesse
Shrestha, Sandesh
Joshi, Arun K.
Huerta-Espino, Julio
Govindan, Velu
Crespo-Herrera, Leonardo Abdiel
Mondal, Suchismita
Kumar, Uttam
Bhati, Pradeep K.
Vishwakarma, Manish
Singh, Ravi P.
Singh, Pawan K.
author_facet Juliana, Philomin
He, Xinyao
Poland, Jesse
Shrestha, Sandesh
Joshi, Arun K.
Huerta-Espino, Julio
Govindan, Velu
Crespo-Herrera, Leonardo Abdiel
Mondal, Suchismita
Kumar, Uttam
Bhati, Pradeep K.
Vishwakarma, Manish
Singh, Ravi P.
Singh, Pawan K.
author_sort Juliana, Philomin
collection PubMed
description Spot blotch caused by the fungus Bipolaris sorokiniana poses a serious threat to bread wheat production in warm and humid wheat-growing regions of the world. Hence, the major objective of this study was to identify consistent genotyping-by-sequencing (GBS) markers associated with spot blotch resistance using genome-wide association mapping on a large set of 6,736 advanced bread wheat breeding lines from the International Maize and Wheat Improvement Center. These lines were phenotyped as seven panels at Agua Fria, Mexico between the 2013–2014 and 2019–2020 crop cycles. We identified 214 significant spot blotch associated GBS markers in all the panels, among which only 96 were significant in more than one panel, indicating a strong environmental effect on the trait and highlights the need for multiple phenotypic evaluations to identify lines with stable spot blotch resistance. The 96 consistent GBS markers were on chromosomes 1A, 1B, 1D, 2A, 3B, 4A, 5B, 5D, 6B, 7A, 7B, and 7D, including markers possibly linked to the Lr46, Sb1, Sb2 and Sb3 genes. We also report the association of the 2NS translocation from Aegilops ventricosa with spot blotch resistance in some environments. Moreover, the spot blotch favorable alleles at the 2NS translocation and two markers on chromosome 3BS (3B_2280114 and 3B_5601689) were associated with increased grain yield evaluated at several environments in Mexico and India, implying that selection for favorable alleles at these loci could enable simultaneous improvement for high grain yield and spot blotch resistance. Furthermore, a significant relationship between the percentage of favorable alleles in the lines and their spot blotch response was observed, which taken together with the multiple minor effect loci identified to be associated with spot blotch in this study, indicate quantitative genetic control of resistance. Overall, the results presented here have extended our knowledge on the genetic basis of spot blotch resistance in bread wheat and further efforts to improve genetic resistance to the disease are needed for reducing current and future losses under climate change.
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spelling pubmed-89285402022-03-18 Genome-Wide Association Mapping Indicates Quantitative Genetic Control of Spot Blotch Resistance in Bread Wheat and the Favorable Effects of Some Spot Blotch Loci on Grain Yield Juliana, Philomin He, Xinyao Poland, Jesse Shrestha, Sandesh Joshi, Arun K. Huerta-Espino, Julio Govindan, Velu Crespo-Herrera, Leonardo Abdiel Mondal, Suchismita Kumar, Uttam Bhati, Pradeep K. Vishwakarma, Manish Singh, Ravi P. Singh, Pawan K. Front Plant Sci Plant Science Spot blotch caused by the fungus Bipolaris sorokiniana poses a serious threat to bread wheat production in warm and humid wheat-growing regions of the world. Hence, the major objective of this study was to identify consistent genotyping-by-sequencing (GBS) markers associated with spot blotch resistance using genome-wide association mapping on a large set of 6,736 advanced bread wheat breeding lines from the International Maize and Wheat Improvement Center. These lines were phenotyped as seven panels at Agua Fria, Mexico between the 2013–2014 and 2019–2020 crop cycles. We identified 214 significant spot blotch associated GBS markers in all the panels, among which only 96 were significant in more than one panel, indicating a strong environmental effect on the trait and highlights the need for multiple phenotypic evaluations to identify lines with stable spot blotch resistance. The 96 consistent GBS markers were on chromosomes 1A, 1B, 1D, 2A, 3B, 4A, 5B, 5D, 6B, 7A, 7B, and 7D, including markers possibly linked to the Lr46, Sb1, Sb2 and Sb3 genes. We also report the association of the 2NS translocation from Aegilops ventricosa with spot blotch resistance in some environments. Moreover, the spot blotch favorable alleles at the 2NS translocation and two markers on chromosome 3BS (3B_2280114 and 3B_5601689) were associated with increased grain yield evaluated at several environments in Mexico and India, implying that selection for favorable alleles at these loci could enable simultaneous improvement for high grain yield and spot blotch resistance. Furthermore, a significant relationship between the percentage of favorable alleles in the lines and their spot blotch response was observed, which taken together with the multiple minor effect loci identified to be associated with spot blotch in this study, indicate quantitative genetic control of resistance. Overall, the results presented here have extended our knowledge on the genetic basis of spot blotch resistance in bread wheat and further efforts to improve genetic resistance to the disease are needed for reducing current and future losses under climate change. Frontiers Media S.A. 2022-03-03 /pmc/articles/PMC8928540/ /pubmed/35310648 http://dx.doi.org/10.3389/fpls.2022.835095 Text en Copyright © 2022 Juliana, He, Poland, Shrestha, Joshi, Huerta-Espino, Govindan, Crespo-Herrera, Mondal, Kumar, Bhati, Vishwakarma, Singh and Singh. https://creativecommons.org/licenses/by/4.0/This is an open-access article distributed under the terms of the Creative Commons Attribution License (CC BY). The use, distribution or reproduction in other forums is permitted, provided the original author(s) and the copyright owner(s) are credited and that the original publication in this journal is cited, in accordance with accepted academic practice. No use, distribution or reproduction is permitted which does not comply with these terms.
spellingShingle Plant Science
Juliana, Philomin
He, Xinyao
Poland, Jesse
Shrestha, Sandesh
Joshi, Arun K.
Huerta-Espino, Julio
Govindan, Velu
Crespo-Herrera, Leonardo Abdiel
Mondal, Suchismita
Kumar, Uttam
Bhati, Pradeep K.
Vishwakarma, Manish
Singh, Ravi P.
Singh, Pawan K.
Genome-Wide Association Mapping Indicates Quantitative Genetic Control of Spot Blotch Resistance in Bread Wheat and the Favorable Effects of Some Spot Blotch Loci on Grain Yield
title Genome-Wide Association Mapping Indicates Quantitative Genetic Control of Spot Blotch Resistance in Bread Wheat and the Favorable Effects of Some Spot Blotch Loci on Grain Yield
title_full Genome-Wide Association Mapping Indicates Quantitative Genetic Control of Spot Blotch Resistance in Bread Wheat and the Favorable Effects of Some Spot Blotch Loci on Grain Yield
title_fullStr Genome-Wide Association Mapping Indicates Quantitative Genetic Control of Spot Blotch Resistance in Bread Wheat and the Favorable Effects of Some Spot Blotch Loci on Grain Yield
title_full_unstemmed Genome-Wide Association Mapping Indicates Quantitative Genetic Control of Spot Blotch Resistance in Bread Wheat and the Favorable Effects of Some Spot Blotch Loci on Grain Yield
title_short Genome-Wide Association Mapping Indicates Quantitative Genetic Control of Spot Blotch Resistance in Bread Wheat and the Favorable Effects of Some Spot Blotch Loci on Grain Yield
title_sort genome-wide association mapping indicates quantitative genetic control of spot blotch resistance in bread wheat and the favorable effects of some spot blotch loci on grain yield
topic Plant Science
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8928540/
https://www.ncbi.nlm.nih.gov/pubmed/35310648
http://dx.doi.org/10.3389/fpls.2022.835095
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