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Binary-state scanning probe microscopy for parallel imaging

Scanning probe microscopy techniques, such as atomic force microscopy and scanning tunnelling microscopy, are harnessed to image nanoscale structures with an exquisite resolution, which has been of significant value in a variety of areas of nanotechnology. These scanning probe techniques, however, a...

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Detalles Bibliográficos
Autores principales:	Kim, Gwangmook, Kim, Eoh Jin, Do, Hyung Wan, Cho, Min-Kyun, Kim, Sungsoon, Kang, Shinill, Kim, Dohun, Cheon, Jinwoo, Shim, Wooyoung
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Nature Publishing Group UK 2022
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8931021/ https://www.ncbi.nlm.nih.gov/pubmed/35301324 http://dx.doi.org/10.1038/s41467-022-29181-z

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