Influence of ZnF(2) and WO(3) on Radiation Attenuation Features of Oxyfluoride Tellurite WO(3)-ZnF(2)-TeO(2) Glasses Using Phy-X/PSD Software

The radiation shielding features of the ternary oxyfluoride tellurite glasses were studied by calculating different shielding factors. The effect of the TeO(2), WO(3,) and ZnF(2) on the tested glass system’s attenuating performance was predicted from the examination. The mass attenuation coefficient (µ/ρ) values for the oxyfluoride tellurite glasses depend highly on the concentration of WO(3,) as well as ZnF(2). All the present ZnFWTe1-ZnFWTe5 samples have higher µ/ρ values than that of the pure TeO(2) glass at all energies. For the samples with a fixed content of WO(3), the replacement of TeO(2) by ZnF(2) increases the µ/ρ, while for the glasses with a fixed content of TeO(2), the replacement of WO(3) by ZnF(2) results in a decline in the µ/ρ values. The results revealed that ZnFWTe4 has the lowest linear attenuation coefficient (µ) among the oxyfluoride tellurite glasses, whereby it has a slightly higher value than pure TeO(2) glass. The maximum effective atomic number (Z(eff)) is found at 0.284 MeV and varied between 31.75 and 34.30 for the tested glasses; it equaled to 30.29 for the pure TeO(2) glass. The half-value layer (HVL) of the glasses showed a gradual decline with increasing density. The pure TeO(2) was revealed to have thicker HVL than the selected oxyfluoride tellurite glasses. A 1.901-cm thickness of the sample, ZnFWTe1, is required to decrease the intensity of a photon with an energy of 0.284 MeV to one-tenth of its original, whereas 1.936, 1.956, 2.212, and 2.079 cm are required for glasses ZnFWTe2, ZnFWTe3, ZnFWTe4, and ZnFWTe5, respectively.