Effects of Electron Microscope Parameters and Sample Thickness on High Angle Annular Dark Field Imaging

Scanning transmission electron microscopy (STEM) developed into a very important characterization tool for atomic analysis of crystalline specimens. High-angle annular dark field (HAADF) scanning transmission electron microscopy (STEM) has become one of the most powerful tools to visualize material...

Descripción completa

Detalles Bibliográficos
Autores principales: Yang, Pucheng, Li, Zheng, Yang, Yi, Li, Rui, Qin, Lufei, Zou, Yunhao
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Hindawi 2022
Materias:
Review Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8958084/
https://www.ncbi.nlm.nih.gov/pubmed/35360524
http://dx.doi.org/10.1155/2022/8503314
Descripción
Sumario:Scanning transmission electron microscopy (STEM) developed into a very important characterization tool for atomic analysis of crystalline specimens. High-angle annular dark field (HAADF) scanning transmission electron microscopy (STEM) has become one of the most powerful tools to visualize material structures at atomic resolution. However, the parameter of electron microscope and sample thickness is the important influence factors on HAADF-STEM imaging. The effect of convergence angle, spherical aberration, and defocus to HAADF imaging process has been analyzed through simulation. The applicability of two HAADF simulation software has been compared, and suggestions for their usage have been given.

Ejemplares similares