Effects of Electron Microscope Parameters and Sample Thickness on High Angle Annular Dark Field Imaging

Scanning transmission electron microscopy (STEM) developed into a very important characterization tool for atomic analysis of crystalline specimens. High-angle annular dark field (HAADF) scanning transmission electron microscopy (STEM) has become one of the most powerful tools to visualize material...

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Detalles Bibliográficos
Autores principales: Yang, Pucheng, Li, Zheng, Yang, Yi, Li, Rui, Qin, Lufei, Zou, Yunhao
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Hindawi 2022
Materias:
Review Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8958084/
https://www.ncbi.nlm.nih.gov/pubmed/35360524
http://dx.doi.org/10.1155/2022/8503314
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author Yang, Pucheng
Li, Zheng
Yang, Yi
Li, Rui
Qin, Lufei
Zou, Yunhao
author_facet Yang, Pucheng
Li, Zheng
Yang, Yi
Li, Rui
Qin, Lufei
Zou, Yunhao
author_sort Yang, Pucheng
collection PubMed
description Scanning transmission electron microscopy (STEM) developed into a very important characterization tool for atomic analysis of crystalline specimens. High-angle annular dark field (HAADF) scanning transmission electron microscopy (STEM) has become one of the most powerful tools to visualize material structures at atomic resolution. However, the parameter of electron microscope and sample thickness is the important influence factors on HAADF-STEM imaging. The effect of convergence angle, spherical aberration, and defocus to HAADF imaging process has been analyzed through simulation. The applicability of two HAADF simulation software has been compared, and suggestions for their usage have been given.
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spelling pubmed-89580842022-03-30 Effects of Electron Microscope Parameters and Sample Thickness on High Angle Annular Dark Field Imaging Yang, Pucheng Li, Zheng Yang, Yi Li, Rui Qin, Lufei Zou, Yunhao Scanning Review Article Scanning transmission electron microscopy (STEM) developed into a very important characterization tool for atomic analysis of crystalline specimens. High-angle annular dark field (HAADF) scanning transmission electron microscopy (STEM) has become one of the most powerful tools to visualize material structures at atomic resolution. However, the parameter of electron microscope and sample thickness is the important influence factors on HAADF-STEM imaging. The effect of convergence angle, spherical aberration, and defocus to HAADF imaging process has been analyzed through simulation. The applicability of two HAADF simulation software has been compared, and suggestions for their usage have been given. Hindawi 2022-03-20 /pmc/articles/PMC8958084/ /pubmed/35360524 http://dx.doi.org/10.1155/2022/8503314 Text en Copyright © 2022 Pucheng Yang et al. https://creativecommons.org/licenses/by/4.0/This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
spellingShingle Review Article
Yang, Pucheng
Li, Zheng
Yang, Yi
Li, Rui
Qin, Lufei
Zou, Yunhao
Effects of Electron Microscope Parameters and Sample Thickness on High Angle Annular Dark Field Imaging
title Effects of Electron Microscope Parameters and Sample Thickness on High Angle Annular Dark Field Imaging
title_full Effects of Electron Microscope Parameters and Sample Thickness on High Angle Annular Dark Field Imaging
title_fullStr Effects of Electron Microscope Parameters and Sample Thickness on High Angle Annular Dark Field Imaging
title_full_unstemmed Effects of Electron Microscope Parameters and Sample Thickness on High Angle Annular Dark Field Imaging
title_short Effects of Electron Microscope Parameters and Sample Thickness on High Angle Annular Dark Field Imaging
title_sort effects of electron microscope parameters and sample thickness on high angle annular dark field imaging
topic Review Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8958084/
https://www.ncbi.nlm.nih.gov/pubmed/35360524
http://dx.doi.org/10.1155/2022/8503314
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