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Effects of Electron Microscope Parameters and Sample Thickness on High Angle Annular Dark Field Imaging

Scanning transmission electron microscopy (STEM) developed into a very important characterization tool for atomic analysis of crystalline specimens. High-angle annular dark field (HAADF) scanning transmission electron microscopy (STEM) has become one of the most powerful tools to visualize material...

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Detalles Bibliográficos
Autores principales:	Yang, Pucheng, Li, Zheng, Yang, Yi, Li, Rui, Qin, Lufei, Zou, Yunhao
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Hindawi 2022
Materias:	Review Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8958084/ https://www.ncbi.nlm.nih.gov/pubmed/35360524 http://dx.doi.org/10.1155/2022/8503314

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