NanoSIMS Analysis of Rare Earth Elements in Silicate Glass and Zircon: Implications for Partition Coefficients

We have developed a method to analyze all rare earth elements in silicate glasses and zircon minerals using a high lateral resolution secondary ion mass spectrometer (NanoSIMS). A 2nA O(−) primary beam was used to sputter a 7–8-μm diameter crater on the sample surface, and secondary positive ions we...

Descripción completa

Detalles Bibliográficos
Autores principales: Shi, Lanlan, Sano, Yuji, Takahata, Naoto, Koike, Mizuho, Morita, Takuya, Koyama, Yuta, Kagoshima, Takanori, Li, Yuan, Xu, Sheng, Liu, Congqiang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Frontiers Media S.A. 2022
Materias:
Chemistry
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8963819/
https://www.ncbi.nlm.nih.gov/pubmed/35360544
http://dx.doi.org/10.3389/fchem.2022.844953

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8963819/
https://www.ncbi.nlm.nih.gov/pubmed/35360544
http://dx.doi.org/10.3389/fchem.2022.844953

Ejemplares similares