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NanoSIMS Analysis of Rare Earth Elements in Silicate Glass and Zircon: Implications for Partition Coefficients
We have developed a method to analyze all rare earth elements in silicate glasses and zircon minerals using a high lateral resolution secondary ion mass spectrometer (NanoSIMS). A 2nA O(−) primary beam was used to sputter a 7–8-μm diameter crater on the sample surface, and secondary positive ions we...
Autores principales: | Shi, Lanlan, Sano, Yuji, Takahata, Naoto, Koike, Mizuho, Morita, Takuya, Koyama, Yuta, Kagoshima, Takanori, Li, Yuan, Xu, Sheng, Liu, Congqiang |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Frontiers Media S.A.
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8963819/ https://www.ncbi.nlm.nih.gov/pubmed/35360544 http://dx.doi.org/10.3389/fchem.2022.844953 |
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