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Correction: Deep learning in optical metrology: a review

Detalles Bibliográficos
Autores principales: Zuo, Chao, Qian, Jiaming, Feng, Shijie, Yin, Wei, Li, Yixuan, Fan, Pengfei, Han, Jing, Qian, Kemao, Chen, Qian
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8964672/
https://www.ncbi.nlm.nih.gov/pubmed/35351854
http://dx.doi.org/10.1038/s41377-022-00757-0
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author Zuo, Chao
Qian, Jiaming
Feng, Shijie
Yin, Wei
Li, Yixuan
Fan, Pengfei
Han, Jing
Qian, Kemao
Chen, Qian
author_facet Zuo, Chao
Qian, Jiaming
Feng, Shijie
Yin, Wei
Li, Yixuan
Fan, Pengfei
Han, Jing
Qian, Kemao
Chen, Qian
author_sort Zuo, Chao
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spelling pubmed-89646722022-04-12 Correction: Deep learning in optical metrology: a review Zuo, Chao Qian, Jiaming Feng, Shijie Yin, Wei Li, Yixuan Fan, Pengfei Han, Jing Qian, Kemao Chen, Qian Light Sci Appl Correction Nature Publishing Group UK 2022-03-27 /pmc/articles/PMC8964672/ /pubmed/35351854 http://dx.doi.org/10.1038/s41377-022-00757-0 Text en © The Author(s) 2022 https://creativecommons.org/licenses/by/4.0/Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/ (https://creativecommons.org/licenses/by/4.0/) .
spellingShingle Correction
Zuo, Chao
Qian, Jiaming
Feng, Shijie
Yin, Wei
Li, Yixuan
Fan, Pengfei
Han, Jing
Qian, Kemao
Chen, Qian
Correction: Deep learning in optical metrology: a review
title Correction: Deep learning in optical metrology: a review
title_full Correction: Deep learning in optical metrology: a review
title_fullStr Correction: Deep learning in optical metrology: a review
title_full_unstemmed Correction: Deep learning in optical metrology: a review
title_short Correction: Deep learning in optical metrology: a review
title_sort correction: deep learning in optical metrology: a review
topic Correction
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8964672/
https://www.ncbi.nlm.nih.gov/pubmed/35351854
http://dx.doi.org/10.1038/s41377-022-00757-0
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