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Characterization of Low-Loss Dielectric Materials for High-Speed and High-Frequency Applications
In this study, the Df (dissipation factor or loss tangent) and Dk (dielectric constant or permittivity) of the low-loss dielectric material from three different vendors are measured by the Fabry–Perot open resonator (FPOR) technique. Emphasis is placed on the sample preparation, data collection, and...
Autores principales: | , , , , , , , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9000071/ https://www.ncbi.nlm.nih.gov/pubmed/35407726 http://dx.doi.org/10.3390/ma15072396 |
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author | Lee, Tzu-Nien Lau, John-H Ko, Cheng-Ta Xia, Tim Lin, Eagle Yang, Kai-Ming Lin, Puru-Bruce Peng, Chia-Yu Chang, Leo Chen, Jia-Shiang Fang, Yi-Hsiu Liao, Li-Yueh Charn, Edward Wang, Jason Tseng, Tzyy-Jang |
author_facet | Lee, Tzu-Nien Lau, John-H Ko, Cheng-Ta Xia, Tim Lin, Eagle Yang, Kai-Ming Lin, Puru-Bruce Peng, Chia-Yu Chang, Leo Chen, Jia-Shiang Fang, Yi-Hsiu Liao, Li-Yueh Charn, Edward Wang, Jason Tseng, Tzyy-Jang |
author_sort | Lee, Tzu-Nien |
collection | PubMed |
description | In this study, the Df (dissipation factor or loss tangent) and Dk (dielectric constant or permittivity) of the low-loss dielectric material from three different vendors are measured by the Fabry–Perot open resonator (FPOR) technique. Emphasis is placed on the sample preparation, data collection, and the comparison with the data sheet values provided from vendors. A coplanar waveguide with ground (CPWG) test vehicle with one of these raw dielectric materials (vendor 1) is designed (through Polar and simulation) and fabricated. The impedance of the test vehicle is measured by TDR (time-domain reflectometer), and the effective Dk of the test vehicle is calculated by the real cross-section of the metal line width, spacing, and thickness of the test vehicle and a closed-form equation. In parallel, the insertion loss and return loss are measured with the VNA (vector network analyzer) of the test vehicle. Finally, the measurement and simulation results are correlated. Some recommendations on the low-loss dielectric materials of the Dk and Df are also provided. |
format | Online Article Text |
id | pubmed-9000071 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2022 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-90000712022-04-12 Characterization of Low-Loss Dielectric Materials for High-Speed and High-Frequency Applications Lee, Tzu-Nien Lau, John-H Ko, Cheng-Ta Xia, Tim Lin, Eagle Yang, Kai-Ming Lin, Puru-Bruce Peng, Chia-Yu Chang, Leo Chen, Jia-Shiang Fang, Yi-Hsiu Liao, Li-Yueh Charn, Edward Wang, Jason Tseng, Tzyy-Jang Materials (Basel) Article In this study, the Df (dissipation factor or loss tangent) and Dk (dielectric constant or permittivity) of the low-loss dielectric material from three different vendors are measured by the Fabry–Perot open resonator (FPOR) technique. Emphasis is placed on the sample preparation, data collection, and the comparison with the data sheet values provided from vendors. A coplanar waveguide with ground (CPWG) test vehicle with one of these raw dielectric materials (vendor 1) is designed (through Polar and simulation) and fabricated. The impedance of the test vehicle is measured by TDR (time-domain reflectometer), and the effective Dk of the test vehicle is calculated by the real cross-section of the metal line width, spacing, and thickness of the test vehicle and a closed-form equation. In parallel, the insertion loss and return loss are measured with the VNA (vector network analyzer) of the test vehicle. Finally, the measurement and simulation results are correlated. Some recommendations on the low-loss dielectric materials of the Dk and Df are also provided. MDPI 2022-03-24 /pmc/articles/PMC9000071/ /pubmed/35407726 http://dx.doi.org/10.3390/ma15072396 Text en © 2022 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Lee, Tzu-Nien Lau, John-H Ko, Cheng-Ta Xia, Tim Lin, Eagle Yang, Kai-Ming Lin, Puru-Bruce Peng, Chia-Yu Chang, Leo Chen, Jia-Shiang Fang, Yi-Hsiu Liao, Li-Yueh Charn, Edward Wang, Jason Tseng, Tzyy-Jang Characterization of Low-Loss Dielectric Materials for High-Speed and High-Frequency Applications |
title | Characterization of Low-Loss Dielectric Materials for High-Speed and High-Frequency Applications |
title_full | Characterization of Low-Loss Dielectric Materials for High-Speed and High-Frequency Applications |
title_fullStr | Characterization of Low-Loss Dielectric Materials for High-Speed and High-Frequency Applications |
title_full_unstemmed | Characterization of Low-Loss Dielectric Materials for High-Speed and High-Frequency Applications |
title_short | Characterization of Low-Loss Dielectric Materials for High-Speed and High-Frequency Applications |
title_sort | characterization of low-loss dielectric materials for high-speed and high-frequency applications |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9000071/ https://www.ncbi.nlm.nih.gov/pubmed/35407726 http://dx.doi.org/10.3390/ma15072396 |
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