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A Rapid Detection Method for Fungal Spores from Greenhouse Crops Based on CMOS Image Sensors and Diffraction Fingerprint Feature Processing

The detection and control of fungal spores in greenhouse crops are important for stabilizing and increasing crop yield. At present, the detection of fungal spores mainly adopts the method of combining portable volumetric spore traps and microscope image processing. This method is problematic as it i...

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Autores principales: Wang, Yafei, Mao, Hanping, Xu, Guilin, Zhang, Xiaodong, Zhang, Yakun
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9025222/
https://www.ncbi.nlm.nih.gov/pubmed/35448605
http://dx.doi.org/10.3390/jof8040374
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author Wang, Yafei
Mao, Hanping
Xu, Guilin
Zhang, Xiaodong
Zhang, Yakun
author_facet Wang, Yafei
Mao, Hanping
Xu, Guilin
Zhang, Xiaodong
Zhang, Yakun
author_sort Wang, Yafei
collection PubMed
description The detection and control of fungal spores in greenhouse crops are important for stabilizing and increasing crop yield. At present, the detection of fungal spores mainly adopts the method of combining portable volumetric spore traps and microscope image processing. This method is problematic as it is limited by the small field of view of the microscope and has low efficiency. This study proposes a rapid detection method for fungal spores from greenhouse crops based on CMOS image sensors and diffraction fingerprint feature processing. We built a diffraction fingerprint image acquisition system for fungal spores of greenhouse crops and collected diffraction fingerprint images of three kinds of fungal spores. A total of 13 diffraction fingerprint features were selected for the classification of fungal spores. These 13 characteristic values were divided into 3 categories, main bright fringe, main dark fringe, and center fringe. Then, these three features were calculated to obtain the Peak to Center ratio (PCR), Valley to Center ratio, and Peak to Valley ratio (PVR). Based on these features, logistics regression (LR), K nearest neighbor (KNN), random forest (RF), and support vector machine (SVM) classification models were built. The test results show that the SVM model has a better overall classification performance than the LR, KNN, and RF models. The average accuracy rate of the recognition of three kinds of fungal spores from greenhouse crops under the SVM model was 92.72%, while the accuracy rates of the LR, KNN, and RF models were 84.97%, 87.44%, and 88.72%, respectively. The F1-Score value of the SVM model was higher, and the overall average value reached 89.41%, which was 11.12%, 7.18%, and 5.57% higher than the LR, KNN, and RF models, respectively. Therefore, the method proposed in this study can be used for the remote identification of three fungal spores which can provide a reference for the identification of fungal spores in greenhouse crops and has the advantages of low cost and portability.
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spelling pubmed-90252222022-04-23 A Rapid Detection Method for Fungal Spores from Greenhouse Crops Based on CMOS Image Sensors and Diffraction Fingerprint Feature Processing Wang, Yafei Mao, Hanping Xu, Guilin Zhang, Xiaodong Zhang, Yakun J Fungi (Basel) Article The detection and control of fungal spores in greenhouse crops are important for stabilizing and increasing crop yield. At present, the detection of fungal spores mainly adopts the method of combining portable volumetric spore traps and microscope image processing. This method is problematic as it is limited by the small field of view of the microscope and has low efficiency. This study proposes a rapid detection method for fungal spores from greenhouse crops based on CMOS image sensors and diffraction fingerprint feature processing. We built a diffraction fingerprint image acquisition system for fungal spores of greenhouse crops and collected diffraction fingerprint images of three kinds of fungal spores. A total of 13 diffraction fingerprint features were selected for the classification of fungal spores. These 13 characteristic values were divided into 3 categories, main bright fringe, main dark fringe, and center fringe. Then, these three features were calculated to obtain the Peak to Center ratio (PCR), Valley to Center ratio, and Peak to Valley ratio (PVR). Based on these features, logistics regression (LR), K nearest neighbor (KNN), random forest (RF), and support vector machine (SVM) classification models were built. The test results show that the SVM model has a better overall classification performance than the LR, KNN, and RF models. The average accuracy rate of the recognition of three kinds of fungal spores from greenhouse crops under the SVM model was 92.72%, while the accuracy rates of the LR, KNN, and RF models were 84.97%, 87.44%, and 88.72%, respectively. The F1-Score value of the SVM model was higher, and the overall average value reached 89.41%, which was 11.12%, 7.18%, and 5.57% higher than the LR, KNN, and RF models, respectively. Therefore, the method proposed in this study can be used for the remote identification of three fungal spores which can provide a reference for the identification of fungal spores in greenhouse crops and has the advantages of low cost and portability. MDPI 2022-04-06 /pmc/articles/PMC9025222/ /pubmed/35448605 http://dx.doi.org/10.3390/jof8040374 Text en © 2022 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Wang, Yafei
Mao, Hanping
Xu, Guilin
Zhang, Xiaodong
Zhang, Yakun
A Rapid Detection Method for Fungal Spores from Greenhouse Crops Based on CMOS Image Sensors and Diffraction Fingerprint Feature Processing
title A Rapid Detection Method for Fungal Spores from Greenhouse Crops Based on CMOS Image Sensors and Diffraction Fingerprint Feature Processing
title_full A Rapid Detection Method for Fungal Spores from Greenhouse Crops Based on CMOS Image Sensors and Diffraction Fingerprint Feature Processing
title_fullStr A Rapid Detection Method for Fungal Spores from Greenhouse Crops Based on CMOS Image Sensors and Diffraction Fingerprint Feature Processing
title_full_unstemmed A Rapid Detection Method for Fungal Spores from Greenhouse Crops Based on CMOS Image Sensors and Diffraction Fingerprint Feature Processing
title_short A Rapid Detection Method for Fungal Spores from Greenhouse Crops Based on CMOS Image Sensors and Diffraction Fingerprint Feature Processing
title_sort rapid detection method for fungal spores from greenhouse crops based on cmos image sensors and diffraction fingerprint feature processing
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9025222/
https://www.ncbi.nlm.nih.gov/pubmed/35448605
http://dx.doi.org/10.3390/jof8040374
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