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Towards More Efficient Security Inspection via Deep Learning: A Task-Driven X-ray Image Cropping Scheme
X-ray imaging machines are widely used in border control checkpoints or public transportation, for luggage scanning and inspection. Recent advances in deep learning enabled automatic object detection of X-ray imaging results to largely reduce labor costs. Compared to tasks on natural images, object...
Autores principales: | , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9031191/ https://www.ncbi.nlm.nih.gov/pubmed/35457869 http://dx.doi.org/10.3390/mi13040565 |
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author | Nguyen, Hong Duc Cai, Rizhao Zhao, Heng Kot, Alex C. Wen, Bihan |
author_facet | Nguyen, Hong Duc Cai, Rizhao Zhao, Heng Kot, Alex C. Wen, Bihan |
author_sort | Nguyen, Hong Duc |
collection | PubMed |
description | X-ray imaging machines are widely used in border control checkpoints or public transportation, for luggage scanning and inspection. Recent advances in deep learning enabled automatic object detection of X-ray imaging results to largely reduce labor costs. Compared to tasks on natural images, object detection for X-ray inspection are typically more challenging, due to the varied sizes and aspect ratios of X-ray images, random locations of the small target objects within the redundant background region, etc. In practice, we show that directly applying off-the-shelf deep learning-based detection algorithms for X-ray imagery can be highly time-consuming and ineffective. To this end, we propose a Task-Driven Cropping scheme, dubbed TDC, for improving the deep image detection algorithms towards efficient and effective luggage inspection via X-ray images. Instead of processing the whole X-ray images for object detection, we propose a two-stage strategy, which first adaptively crops X-ray images and only preserves the task-related regions, i.e., the luggage regions for security inspection. A task-specific deep feature extractor is used to rapidly identify the importance of each X-ray image pixel. Only the regions that are useful and related to the detection tasks are kept and passed to the follow-up deep detector. The varied-scale X-ray images are thus reduced to the same size and aspect ratio, which enables a more efficient deep detection pipeline. Besides, to benchmark the effectiveness of X-ray image detection algorithms, we propose a novel dataset for X-ray image detection, dubbed SIXray-D, based on the popular SIXray dataset. In SIXray-D, we provide the complete and more accurate annotations of both object classes and bounding boxes, which enables model training for supervised X-ray detection methods. Our results show that our proposed TDC algorithm can effectively boost popular detection algorithms, by achieving better detection mAPs or reducing the run time. |
format | Online Article Text |
id | pubmed-9031191 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2022 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-90311912022-04-23 Towards More Efficient Security Inspection via Deep Learning: A Task-Driven X-ray Image Cropping Scheme Nguyen, Hong Duc Cai, Rizhao Zhao, Heng Kot, Alex C. Wen, Bihan Micromachines (Basel) Article X-ray imaging machines are widely used in border control checkpoints or public transportation, for luggage scanning and inspection. Recent advances in deep learning enabled automatic object detection of X-ray imaging results to largely reduce labor costs. Compared to tasks on natural images, object detection for X-ray inspection are typically more challenging, due to the varied sizes and aspect ratios of X-ray images, random locations of the small target objects within the redundant background region, etc. In practice, we show that directly applying off-the-shelf deep learning-based detection algorithms for X-ray imagery can be highly time-consuming and ineffective. To this end, we propose a Task-Driven Cropping scheme, dubbed TDC, for improving the deep image detection algorithms towards efficient and effective luggage inspection via X-ray images. Instead of processing the whole X-ray images for object detection, we propose a two-stage strategy, which first adaptively crops X-ray images and only preserves the task-related regions, i.e., the luggage regions for security inspection. A task-specific deep feature extractor is used to rapidly identify the importance of each X-ray image pixel. Only the regions that are useful and related to the detection tasks are kept and passed to the follow-up deep detector. The varied-scale X-ray images are thus reduced to the same size and aspect ratio, which enables a more efficient deep detection pipeline. Besides, to benchmark the effectiveness of X-ray image detection algorithms, we propose a novel dataset for X-ray image detection, dubbed SIXray-D, based on the popular SIXray dataset. In SIXray-D, we provide the complete and more accurate annotations of both object classes and bounding boxes, which enables model training for supervised X-ray detection methods. Our results show that our proposed TDC algorithm can effectively boost popular detection algorithms, by achieving better detection mAPs or reducing the run time. MDPI 2022-03-31 /pmc/articles/PMC9031191/ /pubmed/35457869 http://dx.doi.org/10.3390/mi13040565 Text en © 2022 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Nguyen, Hong Duc Cai, Rizhao Zhao, Heng Kot, Alex C. Wen, Bihan Towards More Efficient Security Inspection via Deep Learning: A Task-Driven X-ray Image Cropping Scheme |
title | Towards More Efficient Security Inspection via Deep Learning: A Task-Driven X-ray Image Cropping Scheme |
title_full | Towards More Efficient Security Inspection via Deep Learning: A Task-Driven X-ray Image Cropping Scheme |
title_fullStr | Towards More Efficient Security Inspection via Deep Learning: A Task-Driven X-ray Image Cropping Scheme |
title_full_unstemmed | Towards More Efficient Security Inspection via Deep Learning: A Task-Driven X-ray Image Cropping Scheme |
title_short | Towards More Efficient Security Inspection via Deep Learning: A Task-Driven X-ray Image Cropping Scheme |
title_sort | towards more efficient security inspection via deep learning: a task-driven x-ray image cropping scheme |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9031191/ https://www.ncbi.nlm.nih.gov/pubmed/35457869 http://dx.doi.org/10.3390/mi13040565 |
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