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Accelerating covering array generation by combinatorial join for industry scale software testing

Combinatorial interaction testing, which is a technique to verify a system with numerous input parameters, employs a mathematical object called a covering array as a test input. This technique generates a limited number of test cases while guaranteeing a given combinatorial coverage. Although this a...

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Autores principales: Ukai, Hiroshi, Qu, Xiao, Washizaki, Hironori, Fukazawa, Yoshiaki
Formato: Online Artículo Texto
Lenguaje:English
Publicado: PeerJ Inc. 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9044240/
https://www.ncbi.nlm.nih.gov/pubmed/35494846
http://dx.doi.org/10.7717/peerj-cs.720
_version_ 1784695062529048576
author Ukai, Hiroshi
Qu, Xiao
Washizaki, Hironori
Fukazawa, Yoshiaki
author_facet Ukai, Hiroshi
Qu, Xiao
Washizaki, Hironori
Fukazawa, Yoshiaki
author_sort Ukai, Hiroshi
collection PubMed
description Combinatorial interaction testing, which is a technique to verify a system with numerous input parameters, employs a mathematical object called a covering array as a test input. This technique generates a limited number of test cases while guaranteeing a given combinatorial coverage. Although this area has been studied extensively, handling constraints among input parameters remains a major challenge, which may significantly increase the cost to generate covering arrays. In this work, we propose a mathematical operation, called “weaken-product based combinatorial join”, which constructs a new covering array from two existing covering arrays. The operation reuses existing covering arrays to save computational resource by increasing parallelism during generation without losing combinatorial coverage of the original arrays. Our proposed method significantly reduce the covering array generation time by 13–96% depending on use case scenarios.
format Online
Article
Text
id pubmed-9044240
institution National Center for Biotechnology Information
language English
publishDate 2022
publisher PeerJ Inc.
record_format MEDLINE/PubMed
spelling pubmed-90442402022-04-28 Accelerating covering array generation by combinatorial join for industry scale software testing Ukai, Hiroshi Qu, Xiao Washizaki, Hironori Fukazawa, Yoshiaki PeerJ Comput Sci Theory and Formal Methods Combinatorial interaction testing, which is a technique to verify a system with numerous input parameters, employs a mathematical object called a covering array as a test input. This technique generates a limited number of test cases while guaranteeing a given combinatorial coverage. Although this area has been studied extensively, handling constraints among input parameters remains a major challenge, which may significantly increase the cost to generate covering arrays. In this work, we propose a mathematical operation, called “weaken-product based combinatorial join”, which constructs a new covering array from two existing covering arrays. The operation reuses existing covering arrays to save computational resource by increasing parallelism during generation without losing combinatorial coverage of the original arrays. Our proposed method significantly reduce the covering array generation time by 13–96% depending on use case scenarios. PeerJ Inc. 2022-02-11 /pmc/articles/PMC9044240/ /pubmed/35494846 http://dx.doi.org/10.7717/peerj-cs.720 Text en ©2022 Ukai et al. https://creativecommons.org/licenses/by/4.0/This is an open access article distributed under the terms of the Creative Commons Attribution License (https://creativecommons.org/licenses/by/4.0/) , which permits unrestricted use, distribution, reproduction and adaptation in any medium and for any purpose provided that it is properly attributed. For attribution, the original author(s), title, publication source (PeerJ Computer Science) and either DOI or URL of the article must be cited.
spellingShingle Theory and Formal Methods
Ukai, Hiroshi
Qu, Xiao
Washizaki, Hironori
Fukazawa, Yoshiaki
Accelerating covering array generation by combinatorial join for industry scale software testing
title Accelerating covering array generation by combinatorial join for industry scale software testing
title_full Accelerating covering array generation by combinatorial join for industry scale software testing
title_fullStr Accelerating covering array generation by combinatorial join for industry scale software testing
title_full_unstemmed Accelerating covering array generation by combinatorial join for industry scale software testing
title_short Accelerating covering array generation by combinatorial join for industry scale software testing
title_sort accelerating covering array generation by combinatorial join for industry scale software testing
topic Theory and Formal Methods
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9044240/
https://www.ncbi.nlm.nih.gov/pubmed/35494846
http://dx.doi.org/10.7717/peerj-cs.720
work_keys_str_mv AT ukaihiroshi acceleratingcoveringarraygenerationbycombinatorialjoinforindustryscalesoftwaretesting
AT quxiao acceleratingcoveringarraygenerationbycombinatorialjoinforindustryscalesoftwaretesting
AT washizakihironori acceleratingcoveringarraygenerationbycombinatorialjoinforindustryscalesoftwaretesting
AT fukazawayoshiaki acceleratingcoveringarraygenerationbycombinatorialjoinforindustryscalesoftwaretesting