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Ratiometric temperature measurement using negative thermal quenching of intrinsic BiFeO(3) semiconductor nanoparticles
A strategy for optical nanothermometry using the negative thermal quenching behavior of intrinsic BiFeO(3) semiconductor nanoparticles has been reported here. X-ray diffraction measurement shows polycrystalline BiFeO(3) nanoparticles with a rhombohedral distorted perovskite structure. Transmission e...
Autores principales: | , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
The Royal Society of Chemistry
2020
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9053172/ https://www.ncbi.nlm.nih.gov/pubmed/35496935 http://dx.doi.org/10.1039/d0ra01896a |
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author | Antić, Željka Prashanthi, K. Kuzman, Sanja Periša, Jovana Ristić, Zoran Palkar, V. R. Dramićanin, Miroslav D. |
author_facet | Antić, Željka Prashanthi, K. Kuzman, Sanja Periša, Jovana Ristić, Zoran Palkar, V. R. Dramićanin, Miroslav D. |
author_sort | Antić, Željka |
collection | PubMed |
description | A strategy for optical nanothermometry using the negative thermal quenching behavior of intrinsic BiFeO(3) semiconductor nanoparticles has been reported here. X-ray diffraction measurement shows polycrystalline BiFeO(3) nanoparticles with a rhombohedral distorted perovskite structure. Transmission electron microscopy shows agglomerated crystalline nanoparticles around 20 nm in size. Photoluminescence measurements show that intensity of the defect level emission increases significantly with temperature, while the intensity of near band emission and other defect levels emissions show an opposite trend. The most important figures of merit for luminescence nanothermometry: the absolute (S(a)) and the relative sensor sensitivity (S(r)) and the temperature resolution (ΔT(m)) were effectively resolved and calculated. The relative sensitivity and temperature resolution values are found to be 2.5% K(−1) and 0.2 K, respectively which are among the highest reported values observed so far for semiconductors. |
format | Online Article Text |
id | pubmed-9053172 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2020 |
publisher | The Royal Society of Chemistry |
record_format | MEDLINE/PubMed |
spelling | pubmed-90531722022-04-29 Ratiometric temperature measurement using negative thermal quenching of intrinsic BiFeO(3) semiconductor nanoparticles Antić, Željka Prashanthi, K. Kuzman, Sanja Periša, Jovana Ristić, Zoran Palkar, V. R. Dramićanin, Miroslav D. RSC Adv Chemistry A strategy for optical nanothermometry using the negative thermal quenching behavior of intrinsic BiFeO(3) semiconductor nanoparticles has been reported here. X-ray diffraction measurement shows polycrystalline BiFeO(3) nanoparticles with a rhombohedral distorted perovskite structure. Transmission electron microscopy shows agglomerated crystalline nanoparticles around 20 nm in size. Photoluminescence measurements show that intensity of the defect level emission increases significantly with temperature, while the intensity of near band emission and other defect levels emissions show an opposite trend. The most important figures of merit for luminescence nanothermometry: the absolute (S(a)) and the relative sensor sensitivity (S(r)) and the temperature resolution (ΔT(m)) were effectively resolved and calculated. The relative sensitivity and temperature resolution values are found to be 2.5% K(−1) and 0.2 K, respectively which are among the highest reported values observed so far for semiconductors. The Royal Society of Chemistry 2020-04-30 /pmc/articles/PMC9053172/ /pubmed/35496935 http://dx.doi.org/10.1039/d0ra01896a Text en This journal is © The Royal Society of Chemistry https://creativecommons.org/licenses/by-nc/3.0/ |
spellingShingle | Chemistry Antić, Željka Prashanthi, K. Kuzman, Sanja Periša, Jovana Ristić, Zoran Palkar, V. R. Dramićanin, Miroslav D. Ratiometric temperature measurement using negative thermal quenching of intrinsic BiFeO(3) semiconductor nanoparticles |
title | Ratiometric temperature measurement using negative thermal quenching of intrinsic BiFeO(3) semiconductor nanoparticles |
title_full | Ratiometric temperature measurement using negative thermal quenching of intrinsic BiFeO(3) semiconductor nanoparticles |
title_fullStr | Ratiometric temperature measurement using negative thermal quenching of intrinsic BiFeO(3) semiconductor nanoparticles |
title_full_unstemmed | Ratiometric temperature measurement using negative thermal quenching of intrinsic BiFeO(3) semiconductor nanoparticles |
title_short | Ratiometric temperature measurement using negative thermal quenching of intrinsic BiFeO(3) semiconductor nanoparticles |
title_sort | ratiometric temperature measurement using negative thermal quenching of intrinsic bifeo(3) semiconductor nanoparticles |
topic | Chemistry |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9053172/ https://www.ncbi.nlm.nih.gov/pubmed/35496935 http://dx.doi.org/10.1039/d0ra01896a |
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