Cargando…
Chemical bonding of nitrogen formed by nitridation of crystalline and amorphous aluminum oxide studied by X-ray photoelectron spectroscopy
Numerous efforts have already been made to optimize nitridation of crystalline sapphire (c-Al(2)O(3)) substrates whereas very little attention has been paid to nitridation of amorphous aluminum oxide layers (a-AlO(x)). An extensive analysis of the reaction of amorphous aluminum oxide films with nitr...
Autores principales: | Lawniczak-Jablonska, K., Zytkiewicz, Z. R., Gieraltowska, S., Sobanska, M., Kuzmiuk, P., Klosek, K. |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
The Royal Society of Chemistry
2020
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9055654/ https://www.ncbi.nlm.nih.gov/pubmed/35519109 http://dx.doi.org/10.1039/d0ra05104g |
Ejemplares similares
-
Investigations of Structural and Electrical Properties of ALD Films Formed with the Ozone Precursor
por: Seweryn, Aleksandra, et al.
Publicado: (2021) -
Local atomic order of the amorphous TaO(x) thin films in relation to their chemical resistivity
por: Lawniczak-Jablonska, Krystyna, et al.
Publicado: (2019) -
Relating X-ray photoelectron spectroscopy data to chemical bonding in MXenes
por: García-Romeral, Néstor, et al.
Publicado: (2021) -
(29)Si NMR Chemical Shifts in Crystalline and Amorphous Silicon Nitrides
por: Ponomarev, Ilia, et al.
Publicado: (2018) -
High-resolution X-ray diffraction analysis of strain distribution in GaN nanowires on Si(111) substrate
por: Stanchu, Hryhorii, et al.
Publicado: (2015)