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Electronic and structural characterisation of polycrystalline platinum disulfide thin films
We employ a combination of scanning tunnelling microscopy (STM) and scanning tunnelling spectroscopy (STS) to investigate the properties of layered PtS(2), synthesised via thermally assisted conversion (TAC) of a metallic Pt thin film. STM measurements reveal the 1T crystal structure of PtS(2), and...
Autores principales: | , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
The Royal Society of Chemistry
2020
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9057923/ https://www.ncbi.nlm.nih.gov/pubmed/35516737 http://dx.doi.org/10.1039/d0ra07405e |
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author | Zhussupbekov, Kuanysh Cullen, Conor P. Zhussupbekova, Ainur Shvets, Igor V. Duesberg, Georg S. McEvoy, Niall Ó Coileáin, Cormac |
author_facet | Zhussupbekov, Kuanysh Cullen, Conor P. Zhussupbekova, Ainur Shvets, Igor V. Duesberg, Georg S. McEvoy, Niall Ó Coileáin, Cormac |
author_sort | Zhussupbekov, Kuanysh |
collection | PubMed |
description | We employ a combination of scanning tunnelling microscopy (STM) and scanning tunnelling spectroscopy (STS) to investigate the properties of layered PtS(2), synthesised via thermally assisted conversion (TAC) of a metallic Pt thin film. STM measurements reveal the 1T crystal structure of PtS(2), and the lattice constant is determined to be 3.58 ± 0.03 Å. STS allowed the electronic structure of individual PtS(2) crystallites to be directly probed and a bandgap of ∼1.03 eV was determined for a 3.8 nm thick flake at liquid nitrogen temperature. These findings substantially expand understanding of the atomic and electronic structure of PtS(2) and indicate that STM is a powerful tool capable of locally probing non-uniform polycrystalline films, such as those produced by TAC. Prior to STM/STS measurements the quality of synthesised TAC PtS(2) was analysed by X-ray photoelectron spectroscopy (XPS) and Raman spectroscopy. These results are of relevance to applications-focussed studies centred on PtS(2) and may inform future efforts to optimise the synthesis conditions for thin film PtS(2). |
format | Online Article Text |
id | pubmed-9057923 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2020 |
publisher | The Royal Society of Chemistry |
record_format | MEDLINE/PubMed |
spelling | pubmed-90579232022-05-04 Electronic and structural characterisation of polycrystalline platinum disulfide thin films Zhussupbekov, Kuanysh Cullen, Conor P. Zhussupbekova, Ainur Shvets, Igor V. Duesberg, Georg S. McEvoy, Niall Ó Coileáin, Cormac RSC Adv Chemistry We employ a combination of scanning tunnelling microscopy (STM) and scanning tunnelling spectroscopy (STS) to investigate the properties of layered PtS(2), synthesised via thermally assisted conversion (TAC) of a metallic Pt thin film. STM measurements reveal the 1T crystal structure of PtS(2), and the lattice constant is determined to be 3.58 ± 0.03 Å. STS allowed the electronic structure of individual PtS(2) crystallites to be directly probed and a bandgap of ∼1.03 eV was determined for a 3.8 nm thick flake at liquid nitrogen temperature. These findings substantially expand understanding of the atomic and electronic structure of PtS(2) and indicate that STM is a powerful tool capable of locally probing non-uniform polycrystalline films, such as those produced by TAC. Prior to STM/STS measurements the quality of synthesised TAC PtS(2) was analysed by X-ray photoelectron spectroscopy (XPS) and Raman spectroscopy. These results are of relevance to applications-focussed studies centred on PtS(2) and may inform future efforts to optimise the synthesis conditions for thin film PtS(2). The Royal Society of Chemistry 2020-11-17 /pmc/articles/PMC9057923/ /pubmed/35516737 http://dx.doi.org/10.1039/d0ra07405e Text en This journal is © The Royal Society of Chemistry https://creativecommons.org/licenses/by-nc/3.0/ |
spellingShingle | Chemistry Zhussupbekov, Kuanysh Cullen, Conor P. Zhussupbekova, Ainur Shvets, Igor V. Duesberg, Georg S. McEvoy, Niall Ó Coileáin, Cormac Electronic and structural characterisation of polycrystalline platinum disulfide thin films |
title | Electronic and structural characterisation of polycrystalline platinum disulfide thin films |
title_full | Electronic and structural characterisation of polycrystalline platinum disulfide thin films |
title_fullStr | Electronic and structural characterisation of polycrystalline platinum disulfide thin films |
title_full_unstemmed | Electronic and structural characterisation of polycrystalline platinum disulfide thin films |
title_short | Electronic and structural characterisation of polycrystalline platinum disulfide thin films |
title_sort | electronic and structural characterisation of polycrystalline platinum disulfide thin films |
topic | Chemistry |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9057923/ https://www.ncbi.nlm.nih.gov/pubmed/35516737 http://dx.doi.org/10.1039/d0ra07405e |
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