Quantifying nanoscale forces using machine learning in dynamic atomic force microscopy

Dynamic atomic force microscopy (AFM) is a key platform that enables topological and nanomechanical characterization of novel materials. This is achieved by linking the nanoscale forces that exist between the AFM tip and the sample to specific mathematical functions through modeling. However, the ma...

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Detalles Bibliográficos
Autores principales: Chandrashekar, Abhilash, Belardinelli, Pierpaolo, Bessa, Miguel A., Staufer, Urs, Alijani, Farbod
Formato: Online Artículo Texto
Lenguaje:English
Publicado: RSC 2022
Materias:
Chemistry
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9063738/
https://www.ncbi.nlm.nih.gov/pubmed/35601812
http://dx.doi.org/10.1039/d2na00011c

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9063738/
https://www.ncbi.nlm.nih.gov/pubmed/35601812
http://dx.doi.org/10.1039/d2na00011c

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