Single-exposure X-ray phase imaging microscopy with a grating interferometer

The advent of hard X-ray free-electron lasers enables nanoscopic X-ray imaging with sub-picosecond temporal resolution. X-ray grating interferometry offers a phase-sensitive full-field imaging technique where the phase retrieval can be carried out from a single exposure alone. Thus, the method is at...

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Detalles Bibliográficos
Autores principales: Wolf, Andreas, Akstaller, Bernhard, Cipiccia, Silvia, Flenner, Silja, Hagemann, Johannes, Ludwig, Veronika, Meyer, Pascal, Schropp, Andreas, Schuster, Max, Seifert, Maria, Weule, Mareike, Michel, Thilo, Anton, Gisela, Funk, Stefan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2022
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9070728/
https://www.ncbi.nlm.nih.gov/pubmed/35511012
http://dx.doi.org/10.1107/S160057752200193X

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