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Degradation of OLED performance by exposure to UV irradiation
Organic light-emitting diode (OLED) displays are highly susceptible to the harsh environmental conditions found outdoors, like exposure to direct sunlight as well as UV radiation and storage temperature, resulting in a loss of luminance and lifespan, pixel shrinkage, and permanent damage and/or malf...
Autores principales: | , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
The Royal Society of Chemistry
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9076695/ https://www.ncbi.nlm.nih.gov/pubmed/35542867 http://dx.doi.org/10.1039/c9ra09730a |
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author | Kwon, Sun-Kap Baek, Ji-Ho Choi, Hyun-Chul Kim, Seong Keun Lampande, Raju Pode, Ramchandra Kwon, Jang Hyuk |
author_facet | Kwon, Sun-Kap Baek, Ji-Ho Choi, Hyun-Chul Kim, Seong Keun Lampande, Raju Pode, Ramchandra Kwon, Jang Hyuk |
author_sort | Kwon, Sun-Kap |
collection | PubMed |
description | Organic light-emitting diode (OLED) displays are highly susceptible to the harsh environmental conditions found outdoors, like exposure to direct sunlight as well as UV radiation and storage temperature, resulting in a loss of luminance and lifespan, pixel shrinkage, and permanent damage and/or malfunction of the panel. Here, we fabricated top emission OLEDs (TEOLEDs) using Yb : LiF (1 : 1, 2 nm)/Ag : Mg (10 : 1, 16 nm) and Mg : LiF (1 : 1, 2 nm)/Ag : Mg (10 : 1, 16 nm) cathode units and the performances of the devices were investigated by subjecting them to UV radiation. A fabricated red TEOLED (control device), employing a standard Mg : LiF (1 : 1, 2 nm) electron injection layer (EIL) and an Ag : Mg (16 nm) cathode, showed a rapid decrease in luminance and a fast increase in driving voltage at 10 mA cm(−2) over time after UV irradiation for 300 h. However, a cathode unit comprising a Yb : LiF (1 : 1, 2 nm) EIL and an Ag : Mg (10 : 1, 16 nm) cathode showed no loss of luminance or increase in driving voltage at 10 mA cm(−2) over time after UV irradiation for 300 h. Therefore, we investigated the changes occurring in both cathode units due to UV irradiation using the lift-out FIB-TEM technique and EDS mapping. With UV irradiation for 300 h, Ag atoms migrated toward the center of the cathode, Mg atoms migrated toward the CPL, and no Mg atoms were observed in the EIL area. In contrast, we observed (i) no substantial migration of Ag atoms and they were located at the center of the cathode, (ii) no migration of Mg atoms toward the CPL layer, and (iii) no movement of Yb atoms after UV irradiation. Furthermore, the UV irradiated red TEOLED with an Mg : LiF (1 : 1, 2 nm) EIL showed (i) deterioration in electron injection into the emissive layer (EML) and an increase in the EIL/metal interface resistance, and (ii) a remarkable shift of the J–V curve to the higher voltage side, while almost no such changes were observed in the TEOLD with a Yb : LiF (1 : 1, 2 nm) EIL. Also, an almost identical RGB pixel emitting area was noticed in the Yb : LiF (1 : 1, 2 nm) based devices after UV irradiation for 300 h. These results suggest that Yb could become a good candidate for the cathode unit, providing better device stability against harsh environmental conditions as well as excellent electron injection properties. |
format | Online Article Text |
id | pubmed-9076695 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2019 |
publisher | The Royal Society of Chemistry |
record_format | MEDLINE/PubMed |
spelling | pubmed-90766952022-05-09 Degradation of OLED performance by exposure to UV irradiation Kwon, Sun-Kap Baek, Ji-Ho Choi, Hyun-Chul Kim, Seong Keun Lampande, Raju Pode, Ramchandra Kwon, Jang Hyuk RSC Adv Chemistry Organic light-emitting diode (OLED) displays are highly susceptible to the harsh environmental conditions found outdoors, like exposure to direct sunlight as well as UV radiation and storage temperature, resulting in a loss of luminance and lifespan, pixel shrinkage, and permanent damage and/or malfunction of the panel. Here, we fabricated top emission OLEDs (TEOLEDs) using Yb : LiF (1 : 1, 2 nm)/Ag : Mg (10 : 1, 16 nm) and Mg : LiF (1 : 1, 2 nm)/Ag : Mg (10 : 1, 16 nm) cathode units and the performances of the devices were investigated by subjecting them to UV radiation. A fabricated red TEOLED (control device), employing a standard Mg : LiF (1 : 1, 2 nm) electron injection layer (EIL) and an Ag : Mg (16 nm) cathode, showed a rapid decrease in luminance and a fast increase in driving voltage at 10 mA cm(−2) over time after UV irradiation for 300 h. However, a cathode unit comprising a Yb : LiF (1 : 1, 2 nm) EIL and an Ag : Mg (10 : 1, 16 nm) cathode showed no loss of luminance or increase in driving voltage at 10 mA cm(−2) over time after UV irradiation for 300 h. Therefore, we investigated the changes occurring in both cathode units due to UV irradiation using the lift-out FIB-TEM technique and EDS mapping. With UV irradiation for 300 h, Ag atoms migrated toward the center of the cathode, Mg atoms migrated toward the CPL, and no Mg atoms were observed in the EIL area. In contrast, we observed (i) no substantial migration of Ag atoms and they were located at the center of the cathode, (ii) no migration of Mg atoms toward the CPL layer, and (iii) no movement of Yb atoms after UV irradiation. Furthermore, the UV irradiated red TEOLED with an Mg : LiF (1 : 1, 2 nm) EIL showed (i) deterioration in electron injection into the emissive layer (EML) and an increase in the EIL/metal interface resistance, and (ii) a remarkable shift of the J–V curve to the higher voltage side, while almost no such changes were observed in the TEOLD with a Yb : LiF (1 : 1, 2 nm) EIL. Also, an almost identical RGB pixel emitting area was noticed in the Yb : LiF (1 : 1, 2 nm) based devices after UV irradiation for 300 h. These results suggest that Yb could become a good candidate for the cathode unit, providing better device stability against harsh environmental conditions as well as excellent electron injection properties. The Royal Society of Chemistry 2019-12-23 /pmc/articles/PMC9076695/ /pubmed/35542867 http://dx.doi.org/10.1039/c9ra09730a Text en This journal is © The Royal Society of Chemistry https://creativecommons.org/licenses/by/3.0/ |
spellingShingle | Chemistry Kwon, Sun-Kap Baek, Ji-Ho Choi, Hyun-Chul Kim, Seong Keun Lampande, Raju Pode, Ramchandra Kwon, Jang Hyuk Degradation of OLED performance by exposure to UV irradiation |
title | Degradation of OLED performance by exposure to UV irradiation |
title_full | Degradation of OLED performance by exposure to UV irradiation |
title_fullStr | Degradation of OLED performance by exposure to UV irradiation |
title_full_unstemmed | Degradation of OLED performance by exposure to UV irradiation |
title_short | Degradation of OLED performance by exposure to UV irradiation |
title_sort | degradation of oled performance by exposure to uv irradiation |
topic | Chemistry |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9076695/ https://www.ncbi.nlm.nih.gov/pubmed/35542867 http://dx.doi.org/10.1039/c9ra09730a |
work_keys_str_mv | AT kwonsunkap degradationofoledperformancebyexposuretouvirradiation AT baekjiho degradationofoledperformancebyexposuretouvirradiation AT choihyunchul degradationofoledperformancebyexposuretouvirradiation AT kimseongkeun degradationofoledperformancebyexposuretouvirradiation AT lampanderaju degradationofoledperformancebyexposuretouvirradiation AT poderamchandra degradationofoledperformancebyexposuretouvirradiation AT kwonjanghyuk degradationofoledperformancebyexposuretouvirradiation |