Enhanced efficiency of Cu(2)ZnSn(S,Se)(4) solar cells via anti-reflectance properties and surface passivation by atomic layer deposited aluminum oxide

Reducing interface recombination losses is one of the major challenges in developing Cu(2)ZnSn(S,Se)(4) (CZTSSe) solar cells. Here, we propose a CZTSSe solar cell with an atomic layer deposited Al(2)O(3) thin film for surface passivation. The influence of passivation layer thickness on the power conversion efficiency (PCE), short-circuit current density (J(sc)), open-circuit voltage (V(oc)) and fill factor (FF) of the solar cell is systematically investigated. It is found that the Al(2)O(3) film presents notable antireflection (AR) properties over a broad range of wavelengths (350–1000 nm) for CZTSSe solar cells. With increasing Al(2)O(3) thickness (1–10 nm), the average reflectance of the CZTSSe film decreases from 12.9% to 9.6%, compared with the average reflectance of 13.6% for the CZTSSe film without Al(2)O(3). The Al(2)O(3) passivation layer also contributes to suppressed surface recombination and enhanced carrier separation. Passivation performance is related to chemical and field effect passivation, which is due to released H atoms from the Al–OH bonds and the formation of Al vacancies and O interstitials within Al(2)O(3) films. Therefore, the J(sc) and V(oc) of the CZTSSe solar cell with 2 nm-Al(2)O(3) were increased by 37.8% and 57.8%, respectively, in comparison with those of the unpassivated sample. An optimal CZTSSe solar cell was obtained with a V(oc), J(sc) and η of 0.361 V, 33.78 mA and 5.66%. Our results indicate that Al(2)O(3) films show the dual functions of AR and surface passivation for photovoltaic applications.