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Atomic-scale investigation of MgO growth on fused quartz using angle-dependent NEXAFS measurements

The phenomena related to thin film growth have always been interesting to the scientific community. Experiments related to these phenomena not only provide an understanding but also suggest a path for the controlled growth of these films. For the present work, MgO thin film growth on fused quartz wa...

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Autores principales: Singh, Jitendra Pal, Kim, So Hee, Won, Sung Ok, Lee, Ik-Jae, Chae, Keun Hwa
Formato: Online Artículo Texto
Lenguaje:English
Publicado: The Royal Society of Chemistry 2018
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9085907/
https://www.ncbi.nlm.nih.gov/pubmed/35548246
http://dx.doi.org/10.1039/c8ra02873g
_version_ 1784703921712791552
author Singh, Jitendra Pal
Kim, So Hee
Won, Sung Ok
Lee, Ik-Jae
Chae, Keun Hwa
author_facet Singh, Jitendra Pal
Kim, So Hee
Won, Sung Ok
Lee, Ik-Jae
Chae, Keun Hwa
author_sort Singh, Jitendra Pal
collection PubMed
description The phenomena related to thin film growth have always been interesting to the scientific community. Experiments related to these phenomena not only provide an understanding but also suggest a path for the controlled growth of these films. For the present work, MgO thin film growth on fused quartz was investigated using angle-dependent near-edge X-ray absorption fine structure (NEXAFS) measurements. To understand the growth of MgO, sputtering was allowed for 5, 10, 25, 36, 49, 81, 144, 256, and 400 min in a vacuum better than 5.0 × 10(−7) torr. NEXAFS measurements revealed the evolution of MgO at the surface of fused quartz for sputtering durations of 144, 256, and 400 min. Below these sputtering durations, no MgO was observed. NEXAFS measurements further envisaged a systematic improvement of Mg(2+) ion coordination in the MgO lattice with the sputtering duration. The onset of non-interacting molecular oxygen on the surface of the sputtered species on fused quartz was also observed for sputtering duration up to 81 min. Angle-dependent measurements exhibited the onset of an anisotropic nature of the formed chemical bonds with sputtering, which dominated for higher sputtering duration. X-ray diffraction (XRD) studies carried out for sputtering durations of 144, 256, and 400 min exhibited the presence of the rocksalt phase of MgO. Annealing at 700 °C led to the dominant local electronic structure and improved the crystallinity of MgO. Rutherford backscattering spectrometry (RBS) and cross-sectional scanning electron microscopy (SEM) revealed a layer of almost 80 nm was obtained for a sputtering duration of 400 min. Thus, these angle-dependent NEXAFS measurements along with XRD, RBS, and SEM analyses were able to give a complete account for the growth of the thin films. Moreover, information specific to the coordination of the ions, which is important in case of ultrathin films, could be obtained successfully using this technique.
format Online
Article
Text
id pubmed-9085907
institution National Center for Biotechnology Information
language English
publishDate 2018
publisher The Royal Society of Chemistry
record_format MEDLINE/PubMed
spelling pubmed-90859072022-05-10 Atomic-scale investigation of MgO growth on fused quartz using angle-dependent NEXAFS measurements Singh, Jitendra Pal Kim, So Hee Won, Sung Ok Lee, Ik-Jae Chae, Keun Hwa RSC Adv Chemistry The phenomena related to thin film growth have always been interesting to the scientific community. Experiments related to these phenomena not only provide an understanding but also suggest a path for the controlled growth of these films. For the present work, MgO thin film growth on fused quartz was investigated using angle-dependent near-edge X-ray absorption fine structure (NEXAFS) measurements. To understand the growth of MgO, sputtering was allowed for 5, 10, 25, 36, 49, 81, 144, 256, and 400 min in a vacuum better than 5.0 × 10(−7) torr. NEXAFS measurements revealed the evolution of MgO at the surface of fused quartz for sputtering durations of 144, 256, and 400 min. Below these sputtering durations, no MgO was observed. NEXAFS measurements further envisaged a systematic improvement of Mg(2+) ion coordination in the MgO lattice with the sputtering duration. The onset of non-interacting molecular oxygen on the surface of the sputtered species on fused quartz was also observed for sputtering duration up to 81 min. Angle-dependent measurements exhibited the onset of an anisotropic nature of the formed chemical bonds with sputtering, which dominated for higher sputtering duration. X-ray diffraction (XRD) studies carried out for sputtering durations of 144, 256, and 400 min exhibited the presence of the rocksalt phase of MgO. Annealing at 700 °C led to the dominant local electronic structure and improved the crystallinity of MgO. Rutherford backscattering spectrometry (RBS) and cross-sectional scanning electron microscopy (SEM) revealed a layer of almost 80 nm was obtained for a sputtering duration of 400 min. Thus, these angle-dependent NEXAFS measurements along with XRD, RBS, and SEM analyses were able to give a complete account for the growth of the thin films. Moreover, information specific to the coordination of the ions, which is important in case of ultrathin films, could be obtained successfully using this technique. The Royal Society of Chemistry 2018-09-05 /pmc/articles/PMC9085907/ /pubmed/35548246 http://dx.doi.org/10.1039/c8ra02873g Text en This journal is © The Royal Society of Chemistry https://creativecommons.org/licenses/by-nc/3.0/
spellingShingle Chemistry
Singh, Jitendra Pal
Kim, So Hee
Won, Sung Ok
Lee, Ik-Jae
Chae, Keun Hwa
Atomic-scale investigation of MgO growth on fused quartz using angle-dependent NEXAFS measurements
title Atomic-scale investigation of MgO growth on fused quartz using angle-dependent NEXAFS measurements
title_full Atomic-scale investigation of MgO growth on fused quartz using angle-dependent NEXAFS measurements
title_fullStr Atomic-scale investigation of MgO growth on fused quartz using angle-dependent NEXAFS measurements
title_full_unstemmed Atomic-scale investigation of MgO growth on fused quartz using angle-dependent NEXAFS measurements
title_short Atomic-scale investigation of MgO growth on fused quartz using angle-dependent NEXAFS measurements
title_sort atomic-scale investigation of mgo growth on fused quartz using angle-dependent nexafs measurements
topic Chemistry
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9085907/
https://www.ncbi.nlm.nih.gov/pubmed/35548246
http://dx.doi.org/10.1039/c8ra02873g
work_keys_str_mv AT singhjitendrapal atomicscaleinvestigationofmgogrowthonfusedquartzusingangledependentnexafsmeasurements
AT kimsohee atomicscaleinvestigationofmgogrowthonfusedquartzusingangledependentnexafsmeasurements
AT wonsungok atomicscaleinvestigationofmgogrowthonfusedquartzusingangledependentnexafsmeasurements
AT leeikjae atomicscaleinvestigationofmgogrowthonfusedquartzusingangledependentnexafsmeasurements
AT chaekeunhwa atomicscaleinvestigationofmgogrowthonfusedquartzusingangledependentnexafsmeasurements