Accurate Atomic-Scale Imaging of Two-Dimensional Lattices Using Atomic Force Microscopy in Ambient Conditions

To facilitate the rapid development of van der Waals materials and heterostructures, scanning probe methods capable of nondestructively visualizing atomic lattices and moiré superlattices are highly desirable. Lateral force microscopy (LFM), which measures nanoscale friction based on the commonly av...

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Detalles Bibliográficos
Autores principales: Kim, Sunghyun, Moon, Donghyeon, Jeon, Bo Ram, Yeon, Jegyeong, Li, Xiaoqin, Kim, Suenne
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9104726/
https://www.ncbi.nlm.nih.gov/pubmed/35564252
http://dx.doi.org/10.3390/nano12091542

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