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Optical metrology embraces deep learning: keeping an open mind
Optical metrology practitioners ought to embrace deep learning with an open mind, while devote continuing efforts to look for its theoretical groundwork and maintain an awareness of its limits.
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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Nature Publishing Group UK
2022
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9110409/ https://www.ncbi.nlm.nih.gov/pubmed/35577800 http://dx.doi.org/10.1038/s41377-022-00829-1 |
| _version_ | 1784709096895676416 |
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| author | Pan, Bing |
| author_facet | Pan, Bing |
| author_sort | Pan, Bing |
| collection | PubMed |
| description | Optical metrology practitioners ought to embrace deep learning with an open mind, while devote continuing efforts to look for its theoretical groundwork and maintain an awareness of its limits. |
| format | Online Article Text |
| id | pubmed-9110409 |
| institution | National Center for Biotechnology Information |
| language | English |
| publishDate | 2022 |
| publisher | Nature Publishing Group UK |
| record_format | MEDLINE/PubMed |
| spelling | pubmed-91104092022-05-18 Optical metrology embraces deep learning: keeping an open mind Pan, Bing Light Sci Appl News & Views Optical metrology practitioners ought to embrace deep learning with an open mind, while devote continuing efforts to look for its theoretical groundwork and maintain an awareness of its limits. Nature Publishing Group UK 2022-05-17 /pmc/articles/PMC9110409/ /pubmed/35577800 http://dx.doi.org/10.1038/s41377-022-00829-1 Text en © The Author(s) 2022 https://creativecommons.org/licenses/by/4.0/Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/ (https://creativecommons.org/licenses/by/4.0/) . |
| spellingShingle | News & Views Pan, Bing Optical metrology embraces deep learning: keeping an open mind |
| title | Optical metrology embraces deep learning: keeping an open mind |
| title_full | Optical metrology embraces deep learning: keeping an open mind |
| title_fullStr | Optical metrology embraces deep learning: keeping an open mind |
| title_full_unstemmed | Optical metrology embraces deep learning: keeping an open mind |
| title_short | Optical metrology embraces deep learning: keeping an open mind |
| title_sort | optical metrology embraces deep learning: keeping an open mind |
| topic | News & Views |
| url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9110409/ https://www.ncbi.nlm.nih.gov/pubmed/35577800 http://dx.doi.org/10.1038/s41377-022-00829-1 |
| work_keys_str_mv | AT panbing opticalmetrologyembracesdeeplearningkeepinganopenmind |