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Optical metrology embraces deep learning: keeping an open mind
Optical metrology practitioners ought to embrace deep learning with an open mind, while devote continuing efforts to look for its theoretical groundwork and maintain an awareness of its limits.
Autor principal: | Pan, Bing |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9110409/ https://www.ncbi.nlm.nih.gov/pubmed/35577800 http://dx.doi.org/10.1038/s41377-022-00829-1 |
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