Noise logic with an InGaN/SiN(x)/Si uniband diode photodetector

Noise logic is introduced by the wavelength dependent photocurrent noise of an InGaN/SiN(x)/Si uniband diode photodetector. A wavelength versus photocurrent noise discrimination map is constructed from the larger photocurrent noise for red light than that for green light. A minimum measurement time of four seconds is deduced from the standard deviation of the photocurrent noise for a safe wavelength distinction. A logic NOT gate is realized as representative with on or off red or green light as binary 1 or 0 inputs and the photocurrent noise above or below a defined threshold as binary 1 or 0 outputs.