Influence of Si wall thickness of CsI(Tl) micro-square-frustums on the performance of the structured CsI(Tl) scintillation screen in X-ray imaging

To improve the detection efficiency of the structured scintillation screen with CsI(Tl) micro-square-frustums based on oxidized Si micropore array template in the case of a period as small as microns, the influence of Si wall thickness of the CsI(Tl) micro-square-frustums on the performance of the s...

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Autores principales: Sun, Zhixiang, Gu, Mu, Liu, Xiaolin, Liu, Bo, Zhang, Juannan, Huang, Shiming, Ni, Chen
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9130278/
https://www.ncbi.nlm.nih.gov/pubmed/35610282
http://dx.doi.org/10.1038/s41598-022-12673-9
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author Sun, Zhixiang
Gu, Mu
Liu, Xiaolin
Liu, Bo
Zhang, Juannan
Huang, Shiming
Ni, Chen
author_facet Sun, Zhixiang
Gu, Mu
Liu, Xiaolin
Liu, Bo
Zhang, Juannan
Huang, Shiming
Ni, Chen
author_sort Sun, Zhixiang
collection PubMed
description To improve the detection efficiency of the structured scintillation screen with CsI(Tl) micro-square-frustums based on oxidized Si micropore array template in the case of a period as small as microns, the influence of Si wall thickness of the CsI(Tl) micro-square-frustums on the performance of the structured screen in X-ray imaging was investigated. The results show that when CsI(Tl) at the bottom of the screen is structured, the detective quantum efficiency (DQE) improves at almost all spatial frequency as the top thickness of the Si wall t(Si) decreases. However, when CsI (Tl) at the bottom of the screen is not structured, the DQE becomes better at low-frequency and worse at high-frequency as t(Si) decreases. The results can provide guidance for optimizing t(Si) according to the comprehensive requirements of detection efficiency and spatial resolution in X-ray imaging.
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spelling pubmed-91302782022-05-26 Influence of Si wall thickness of CsI(Tl) micro-square-frustums on the performance of the structured CsI(Tl) scintillation screen in X-ray imaging Sun, Zhixiang Gu, Mu Liu, Xiaolin Liu, Bo Zhang, Juannan Huang, Shiming Ni, Chen Sci Rep Article To improve the detection efficiency of the structured scintillation screen with CsI(Tl) micro-square-frustums based on oxidized Si micropore array template in the case of a period as small as microns, the influence of Si wall thickness of the CsI(Tl) micro-square-frustums on the performance of the structured screen in X-ray imaging was investigated. The results show that when CsI(Tl) at the bottom of the screen is structured, the detective quantum efficiency (DQE) improves at almost all spatial frequency as the top thickness of the Si wall t(Si) decreases. However, when CsI (Tl) at the bottom of the screen is not structured, the DQE becomes better at low-frequency and worse at high-frequency as t(Si) decreases. The results can provide guidance for optimizing t(Si) according to the comprehensive requirements of detection efficiency and spatial resolution in X-ray imaging. Nature Publishing Group UK 2022-05-24 /pmc/articles/PMC9130278/ /pubmed/35610282 http://dx.doi.org/10.1038/s41598-022-12673-9 Text en © The Author(s) 2022 https://creativecommons.org/licenses/by/4.0/Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. The images or other third party material in this article are included in the article's Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article's Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/ (https://creativecommons.org/licenses/by/4.0/) .
spellingShingle Article
Sun, Zhixiang
Gu, Mu
Liu, Xiaolin
Liu, Bo
Zhang, Juannan
Huang, Shiming
Ni, Chen
Influence of Si wall thickness of CsI(Tl) micro-square-frustums on the performance of the structured CsI(Tl) scintillation screen in X-ray imaging
title Influence of Si wall thickness of CsI(Tl) micro-square-frustums on the performance of the structured CsI(Tl) scintillation screen in X-ray imaging
title_full Influence of Si wall thickness of CsI(Tl) micro-square-frustums on the performance of the structured CsI(Tl) scintillation screen in X-ray imaging
title_fullStr Influence of Si wall thickness of CsI(Tl) micro-square-frustums on the performance of the structured CsI(Tl) scintillation screen in X-ray imaging
title_full_unstemmed Influence of Si wall thickness of CsI(Tl) micro-square-frustums on the performance of the structured CsI(Tl) scintillation screen in X-ray imaging
title_short Influence of Si wall thickness of CsI(Tl) micro-square-frustums on the performance of the structured CsI(Tl) scintillation screen in X-ray imaging
title_sort influence of si wall thickness of csi(tl) micro-square-frustums on the performance of the structured csi(tl) scintillation screen in x-ray imaging
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9130278/
https://www.ncbi.nlm.nih.gov/pubmed/35610282
http://dx.doi.org/10.1038/s41598-022-12673-9
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