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Mid-Infrared Response from Cr/n-Si Schottky Junction with an Ultra-Thin Cr Metal
Infrared detection technology has been widely applied in many areas. Unlike internal photoemission and the photoelectric mechanism, which are limited by the interface barrier height and material bandgap, the research of the hot carrier effect from nanometer thickness of metal could surpass the capab...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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MDPI
2022
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9143420/ https://www.ncbi.nlm.nih.gov/pubmed/35630971 http://dx.doi.org/10.3390/nano12101750 |