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Analytical technique for self-absorption structure of iron L-emission spectra obtained by soft X-ray emission spectrometer
The method deriving the L self-absorption spectrum from Lα,β emission spectra obtained at different accelerating voltages has been optimized for analyzing the chemical state of Fe in solid materials. Fe Lα,β emission spectra obtained are fitted using Pseudo-Voigt functions and normalized by the inte...
Autores principales: | , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Oxford University Press
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9169537/ https://www.ncbi.nlm.nih.gov/pubmed/35294008 http://dx.doi.org/10.1093/jmicro/dfac009 |
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author | Yokoyama, Takaomi D Takahashi, Hideyuki Koshiya, Shogo Murano, Takanori Terauchi, Masami |
author_facet | Yokoyama, Takaomi D Takahashi, Hideyuki Koshiya, Shogo Murano, Takanori Terauchi, Masami |
author_sort | Yokoyama, Takaomi D |
collection | PubMed |
description | The method deriving the L self-absorption spectrum from Lα,β emission spectra obtained at different accelerating voltages has been optimized for analyzing the chemical state of Fe in solid materials. Fe Lα,β emission spectra obtained are fitted using Pseudo-Voigt functions and normalized by the integrated intensity of each Fe Ll line, which is not affected by L(2,3) absorption edge. The self-absorption spectrum is calculated by dividing the normalized intensity profile collected at low accelerating voltage by that collected at a higher accelerating voltage. The obtained profile is referred to as soft X-ray self-absorption structure (SX-SAS). This method is applied to six Fe-based materials (Fe metal, FeO, Fe(3)O(4,) Fe(2)O(3), FeS and FeS(2)) to observe different chemical states of Fe in those materials. By comparing the self-absorption spectra of iron oxides, one can observe the L(3) absorption peak structure shows a shift to the higher energy side as ferric (3+) Fe increases with respect to ferrous (+2) Fe. The intensity profiles of self-absorption spectra of metallic Fe and FeS(2) shows shoulder structures between the L(3) and L(2) absorption peaks, which were not observed in spectra of Fe oxides. These results indicate that the SX-SAS technique is useful to examine X-ray absorption structure as a means to understand the chemical states of transition metal elements. |
format | Online Article Text |
id | pubmed-9169537 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2022 |
publisher | Oxford University Press |
record_format | MEDLINE/PubMed |
spelling | pubmed-91695372022-06-06 Analytical technique for self-absorption structure of iron L-emission spectra obtained by soft X-ray emission spectrometer Yokoyama, Takaomi D Takahashi, Hideyuki Koshiya, Shogo Murano, Takanori Terauchi, Masami Microscopy (Oxf) Article The method deriving the L self-absorption spectrum from Lα,β emission spectra obtained at different accelerating voltages has been optimized for analyzing the chemical state of Fe in solid materials. Fe Lα,β emission spectra obtained are fitted using Pseudo-Voigt functions and normalized by the integrated intensity of each Fe Ll line, which is not affected by L(2,3) absorption edge. The self-absorption spectrum is calculated by dividing the normalized intensity profile collected at low accelerating voltage by that collected at a higher accelerating voltage. The obtained profile is referred to as soft X-ray self-absorption structure (SX-SAS). This method is applied to six Fe-based materials (Fe metal, FeO, Fe(3)O(4,) Fe(2)O(3), FeS and FeS(2)) to observe different chemical states of Fe in those materials. By comparing the self-absorption spectra of iron oxides, one can observe the L(3) absorption peak structure shows a shift to the higher energy side as ferric (3+) Fe increases with respect to ferrous (+2) Fe. The intensity profiles of self-absorption spectra of metallic Fe and FeS(2) shows shoulder structures between the L(3) and L(2) absorption peaks, which were not observed in spectra of Fe oxides. These results indicate that the SX-SAS technique is useful to examine X-ray absorption structure as a means to understand the chemical states of transition metal elements. Oxford University Press 2022-02-17 /pmc/articles/PMC9169537/ /pubmed/35294008 http://dx.doi.org/10.1093/jmicro/dfac009 Text en © The Author(s) 2022. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. https://creativecommons.org/licenses/by-nc/4.0/This is an Open Access article distributed under the terms of the Creative Commons Attribution-NonCommercial License (https://creativecommons.org/licenses/by-nc/4.0/), which permits non-commercial re-use, distribution, and reproduction in any medium, provided the original work is properly cited. For commercial re-use, please contact journals.permissions@oup.com |
spellingShingle | Article Yokoyama, Takaomi D Takahashi, Hideyuki Koshiya, Shogo Murano, Takanori Terauchi, Masami Analytical technique for self-absorption structure of iron L-emission spectra obtained by soft X-ray emission spectrometer |
title | Analytical technique for self-absorption structure of iron L-emission spectra obtained by soft X-ray emission spectrometer |
title_full | Analytical technique for self-absorption structure of iron L-emission spectra obtained by soft X-ray emission spectrometer |
title_fullStr | Analytical technique for self-absorption structure of iron L-emission spectra obtained by soft X-ray emission spectrometer |
title_full_unstemmed | Analytical technique for self-absorption structure of iron L-emission spectra obtained by soft X-ray emission spectrometer |
title_short | Analytical technique for self-absorption structure of iron L-emission spectra obtained by soft X-ray emission spectrometer |
title_sort | analytical technique for self-absorption structure of iron l-emission spectra obtained by soft x-ray emission spectrometer |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9169537/ https://www.ncbi.nlm.nih.gov/pubmed/35294008 http://dx.doi.org/10.1093/jmicro/dfac009 |
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