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Lower uncertainty bounds of diffraction-based nanoparticle sizes
A self-consistent analysis is reported of traditional diffraction-based particle size determination techniques applied to synthetic diffraction profiles generated with the Patterson approach. The results show that dimensions obtained from traditional techniques utilizing peak fitting or Fourier anal...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2022
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9172029/ https://www.ncbi.nlm.nih.gov/pubmed/35719311 http://dx.doi.org/10.1107/S1600576722002564 |