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Ultrathin, Transparent, and High Density Perovskite Scintillator Film for High Resolution X‐Ray Microscopic Imaging

Inorganic perovskite quantum dots CsPbX(3) (X = Cl, Br, and I) has recently received extensive attention as a new promising class of X‐ray scintillators. However, relatively low light yield (LY) of CsPbX(3) and strong optical scattering of the thick opaque scintillator film restrict their practical...

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Detalles Bibliográficos
Autores principales: Wu, Xiaochen, Guo, Zhao, Zhu, Shuang, Zhang, Bingbing, Guo, Sumin, Dong, Xinghua, Mei, Linqiang, Liu, Ruixue, Su, Chunjian, Gu, Zhanjun
Formato: Online Artículo Texto
Lenguaje:English
Publicado: John Wiley and Sons Inc. 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9189653/
https://www.ncbi.nlm.nih.gov/pubmed/35478488
http://dx.doi.org/10.1002/advs.202200831
Descripción
Sumario:Inorganic perovskite quantum dots CsPbX(3) (X = Cl, Br, and I) has recently received extensive attention as a new promising class of X‐ray scintillators. However, relatively low light yield (LY) of CsPbX(3) and strong optical scattering of the thick opaque scintillator film restrict their practical applications for high‐resolution X‐ray microscopic imaging. Here, the Ce(3+) ion doped CsPbBr(3) nanocrystals (NCs) with enhanced LY and stability are obtained and then the ultrathin (30 µm) and transparent scintillator films with high density are prepared by a suction filtration method. The small amount Ce(3+) dopant greatly enhances the LY of CsPbBr(3) NCs (about 33 000 photons per MeV), which is much higher than that of bare CsPbBr(3) NCs. Moreover, the scintillator films made by these NCs with high density realize a high spatial resolution of 862 nm thanks to its thin and transparent feature, which is so far a record resolution for perovskite scintillator‐based X‐ray microscopic imaging. This strategy not only provides a simple way to increase the resolution down to nanoscale but also extends the application of as‐prepared CsPbBr(3) scintillator for high resolution X‐ray microscopic imaging.