Characterization of Nano-Scale Parallel Lamellar Defects in RDX and HMX Single Crystals by Two-Dimension Small Angle X-ray Scattering

Nano-scale crystal defects extremely affect the security and reliability of explosive charges of weapons. In this work, the nano-scale crystal defects of 1,3,5-trinitro-1,3,5-triazacyclohexane (RDX) and octahydro-1,3,5,7-tetranitro-1,3,5,7-tetrazocine (HMX) single crystals were characterized by two-dimension SAXS. Deducing from the changes of SAXS pattern with sample stage rotating, we firstly found the parallel lamellar nano-scale defects in both RDX and HMX single crystals. Further analysis shows that the average diameter and thickness of nano-scale lamellar defects for RDX single crystal are 66.4 nm and 19.3 nm, respectively. The results of X-ray diffraction (XRD) indicate that the lamellar nano-scale defects distribute along the (001) in RDX and the (011) in HMX, which are verified to be the crystal planes with the lowest binding energy by the theoretical calculation.