Shot-to-shot two-dimensional photon intensity diagnostics within megahertz pulse-trains at the European XFEL

Characterizing the properties of X-ray free-electron laser (XFEL) sources is a critical step for optimization of performance and experiment planning. The recent availability of MHz XFELs has opened up a range of new opportunities for novel experiments but also highlighted the need for systematic mea...

Descripción completa

Detalles Bibliográficos
Autores principales: Guest, Trey W., Bean, Richard, Bielecki, Johan, Birnsteinova, Sarlota, Geloni, Gianluca, Guetg, Marc, Kammering, Raimund, Kirkwood, Henry J., Koch, Andreas, Paganin, David M., van Riessen, Grant, Vagovič, Patrik, de Wijn, Raphael, Mancuso, Adrian P., Abbey, Brian
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2022
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9255581/
https://www.ncbi.nlm.nih.gov/pubmed/35787559
http://dx.doi.org/10.1107/S1600577522005720

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9255581/
https://www.ncbi.nlm.nih.gov/pubmed/35787559
http://dx.doi.org/10.1107/S1600577522005720

Ejemplares similares