Using ISU-GAN for unsupervised small sample defect detection

Surface defect detection is a vital process in industrial production and a significant research direction in computer vision. Although today’s deep learning defect detection methods based on computer vision can achieve high detection accuracy, they are mainly based on supervised learning. They requi...

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Detalles Bibliográficos
Autores principales: Guo, Yijing, Zhong, Linwei, Qiu, Yi, Wang, Huawei, Gao, Fengqiang, Wen, Zongheng, Zhan, Choujun
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9270443/
https://www.ncbi.nlm.nih.gov/pubmed/35803972
http://dx.doi.org/10.1038/s41598-022-15855-7

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9270443/
https://www.ncbi.nlm.nih.gov/pubmed/35803972
http://dx.doi.org/10.1038/s41598-022-15855-7

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