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Nanoscale Visualization of the Electron Conduction Channel in the SiO/Graphite Composite Anode

[Image: see text] Conductive atomic force microscopy (C-AFM) is widely used to determine the electronic conductivity of a sample surface with nanoscale spatial resolution. However, the origin of possible artifacts has not been widely researched, hindering the accurate and reliable interpretation of...

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Autores principales: Park, Gun, Choi, Youngwoo, Shin, Sunyoung, Lee, Yongju, Hong, Seungbum
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2022
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9285628/
https://www.ncbi.nlm.nih.gov/pubmed/35731963
http://dx.doi.org/10.1021/acsami.2c01460
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author Park, Gun
Choi, Youngwoo
Shin, Sunyoung
Lee, Yongju
Hong, Seungbum
author_facet Park, Gun
Choi, Youngwoo
Shin, Sunyoung
Lee, Yongju
Hong, Seungbum
author_sort Park, Gun
collection PubMed
description [Image: see text] Conductive atomic force microscopy (C-AFM) is widely used to determine the electronic conductivity of a sample surface with nanoscale spatial resolution. However, the origin of possible artifacts has not been widely researched, hindering the accurate and reliable interpretation of C-AFM imaging results. Herein, artifact-free C-AFM is used to observe the electron conduction channels in Si-based composite anodes. The origin of a typical C-AFM artifact induced by surface morphology is investigated using a relevant statistical method that enables visualization of the contribution of artifacts in each C-AFM image. The artifact is suppressed by polishing the sample surface using a cooling cross-section polisher, which is confirmed by Pearson correlation analysis. The artifact-free C-AFM image was used to compare the current signals (before and after cycling) from two different composite anodes comprising single-walled carbon nanotubes (SWCNTs) and carbon black as conductive additives. The relationship between the electrical degradation and morphological evolution of the active materials depending on the conductive additive is discussed to explain the improved electrical and electrochemical properties of the electrode containing SWCNTs.
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spelling pubmed-92856282023-06-22 Nanoscale Visualization of the Electron Conduction Channel in the SiO/Graphite Composite Anode Park, Gun Choi, Youngwoo Shin, Sunyoung Lee, Yongju Hong, Seungbum ACS Appl Mater Interfaces [Image: see text] Conductive atomic force microscopy (C-AFM) is widely used to determine the electronic conductivity of a sample surface with nanoscale spatial resolution. However, the origin of possible artifacts has not been widely researched, hindering the accurate and reliable interpretation of C-AFM imaging results. Herein, artifact-free C-AFM is used to observe the electron conduction channels in Si-based composite anodes. The origin of a typical C-AFM artifact induced by surface morphology is investigated using a relevant statistical method that enables visualization of the contribution of artifacts in each C-AFM image. The artifact is suppressed by polishing the sample surface using a cooling cross-section polisher, which is confirmed by Pearson correlation analysis. The artifact-free C-AFM image was used to compare the current signals (before and after cycling) from two different composite anodes comprising single-walled carbon nanotubes (SWCNTs) and carbon black as conductive additives. The relationship between the electrical degradation and morphological evolution of the active materials depending on the conductive additive is discussed to explain the improved electrical and electrochemical properties of the electrode containing SWCNTs. American Chemical Society 2022-06-22 2022-07-13 /pmc/articles/PMC9285628/ /pubmed/35731963 http://dx.doi.org/10.1021/acsami.2c01460 Text en © 2022 The Authors. Published by American Chemical Society https://creativecommons.org/licenses/by-nc-nd/4.0/Permits non-commercial access and re-use, provided that author attribution and integrity are maintained; but does not permit creation of adaptations or other derivative works (https://creativecommons.org/licenses/by-nc-nd/4.0/).
spellingShingle Park, Gun
Choi, Youngwoo
Shin, Sunyoung
Lee, Yongju
Hong, Seungbum
Nanoscale Visualization of the Electron Conduction Channel in the SiO/Graphite Composite Anode
title Nanoscale Visualization of the Electron Conduction Channel in the SiO/Graphite Composite Anode
title_full Nanoscale Visualization of the Electron Conduction Channel in the SiO/Graphite Composite Anode
title_fullStr Nanoscale Visualization of the Electron Conduction Channel in the SiO/Graphite Composite Anode
title_full_unstemmed Nanoscale Visualization of the Electron Conduction Channel in the SiO/Graphite Composite Anode
title_short Nanoscale Visualization of the Electron Conduction Channel in the SiO/Graphite Composite Anode
title_sort nanoscale visualization of the electron conduction channel in the sio/graphite composite anode
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9285628/
https://www.ncbi.nlm.nih.gov/pubmed/35731963
http://dx.doi.org/10.1021/acsami.2c01460
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