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Nanoscale Visualization of the Electron Conduction Channel in the SiO/Graphite Composite Anode
[Image: see text] Conductive atomic force microscopy (C-AFM) is widely used to determine the electronic conductivity of a sample surface with nanoscale spatial resolution. However, the origin of possible artifacts has not been widely researched, hindering the accurate and reliable interpretation of...
| Autores principales: | , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
American Chemical Society
2022
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9285628/ https://www.ncbi.nlm.nih.gov/pubmed/35731963 http://dx.doi.org/10.1021/acsami.2c01460 |