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Nanoscale Visualization of the Electron Conduction Channel in the SiO/Graphite Composite Anode

[Image: see text] Conductive atomic force microscopy (C-AFM) is widely used to determine the electronic conductivity of a sample surface with nanoscale spatial resolution. However, the origin of possible artifacts has not been widely researched, hindering the accurate and reliable interpretation of...

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Detalles Bibliográficos
Autores principales:	Park, Gun, Choi, Youngwoo, Shin, Sunyoung, Lee, Yongju, Hong, Seungbum
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	American Chemical Society 2022
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9285628/ https://www.ncbi.nlm.nih.gov/pubmed/35731963 http://dx.doi.org/10.1021/acsami.2c01460

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