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Ultrastable tip-enhanced hyperspectral optical nanoimaging for defect analysis of large-sized WS(2) layers

Optical nanoimaging techniques, such as tip-enhanced Raman spectroscopy (TERS), are nowadays indispensable for chemical and optical characterization in the entire field of nanotechnology and have been extensively used for various applications, such as visualization of nanoscale defects in two-dimens...

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Autores principales: Kato, Ryo, Moriyama, Toki, Umakoshi, Takayuki, Yano, Taka-aki, Verma, Prabhat
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Association for the Advancement of Science 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9286508/
https://www.ncbi.nlm.nih.gov/pubmed/35857514
http://dx.doi.org/10.1126/sciadv.abo4021
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author Kato, Ryo
Moriyama, Toki
Umakoshi, Takayuki
Yano, Taka-aki
Verma, Prabhat
author_facet Kato, Ryo
Moriyama, Toki
Umakoshi, Takayuki
Yano, Taka-aki
Verma, Prabhat
author_sort Kato, Ryo
collection PubMed
description Optical nanoimaging techniques, such as tip-enhanced Raman spectroscopy (TERS), are nowadays indispensable for chemical and optical characterization in the entire field of nanotechnology and have been extensively used for various applications, such as visualization of nanoscale defects in two-dimensional (2D) materials. However, it is still challenging to investigate micrometer-sized sample with nanoscale spatial resolution because of severe limitation of measurement time due to drift of the experimental system. Here, we achieved long-duration TERS imaging of a micrometer-sized WS(2) sample for 6 hours in a reproducible manner. Our ultrastable TERS system enabled to reveal the defect density on the surface of tungsten disulfide layers in large area equivalent to the device scale. It also helped us to detect rare defect-related optical signals from the sample. The present study paves ways to evaluate nanoscale defects of 2D materials in large area and to unveil remarkable optical and chemical properties of large-sized nanostructured materials.
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spelling pubmed-92865082022-07-29 Ultrastable tip-enhanced hyperspectral optical nanoimaging for defect analysis of large-sized WS(2) layers Kato, Ryo Moriyama, Toki Umakoshi, Takayuki Yano, Taka-aki Verma, Prabhat Sci Adv Physical and Materials Sciences Optical nanoimaging techniques, such as tip-enhanced Raman spectroscopy (TERS), are nowadays indispensable for chemical and optical characterization in the entire field of nanotechnology and have been extensively used for various applications, such as visualization of nanoscale defects in two-dimensional (2D) materials. However, it is still challenging to investigate micrometer-sized sample with nanoscale spatial resolution because of severe limitation of measurement time due to drift of the experimental system. Here, we achieved long-duration TERS imaging of a micrometer-sized WS(2) sample for 6 hours in a reproducible manner. Our ultrastable TERS system enabled to reveal the defect density on the surface of tungsten disulfide layers in large area equivalent to the device scale. It also helped us to detect rare defect-related optical signals from the sample. The present study paves ways to evaluate nanoscale defects of 2D materials in large area and to unveil remarkable optical and chemical properties of large-sized nanostructured materials. American Association for the Advancement of Science 2022-07-15 /pmc/articles/PMC9286508/ /pubmed/35857514 http://dx.doi.org/10.1126/sciadv.abo4021 Text en Copyright © 2022 The Authors, some rights reserved; exclusive licensee American Association for the Advancement of Science. No claim to original U.S. Government Works. Distributed under a Creative Commons Attribution License 4.0 (CC BY). https://creativecommons.org/licenses/by/4.0/This is an open-access article distributed under the terms of the Creative Commons Attribution license (https://creativecommons.org/licenses/by/4.0/) , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
spellingShingle Physical and Materials Sciences
Kato, Ryo
Moriyama, Toki
Umakoshi, Takayuki
Yano, Taka-aki
Verma, Prabhat
Ultrastable tip-enhanced hyperspectral optical nanoimaging for defect analysis of large-sized WS(2) layers
title Ultrastable tip-enhanced hyperspectral optical nanoimaging for defect analysis of large-sized WS(2) layers
title_full Ultrastable tip-enhanced hyperspectral optical nanoimaging for defect analysis of large-sized WS(2) layers
title_fullStr Ultrastable tip-enhanced hyperspectral optical nanoimaging for defect analysis of large-sized WS(2) layers
title_full_unstemmed Ultrastable tip-enhanced hyperspectral optical nanoimaging for defect analysis of large-sized WS(2) layers
title_short Ultrastable tip-enhanced hyperspectral optical nanoimaging for defect analysis of large-sized WS(2) layers
title_sort ultrastable tip-enhanced hyperspectral optical nanoimaging for defect analysis of large-sized ws(2) layers
topic Physical and Materials Sciences
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9286508/
https://www.ncbi.nlm.nih.gov/pubmed/35857514
http://dx.doi.org/10.1126/sciadv.abo4021
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