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End-to-end deep learning framework for printed circuit board manufacturing defect classification
We report a complete deep-learning framework using a single-step object detection model in order to quickly and accurately detect and classify the types of manufacturing defects present on Printed Circuit Board (PCBs). We describe the complete model architecture and compare with the current state-of...
Autores principales: | , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9307836/ https://www.ncbi.nlm.nih.gov/pubmed/35869131 http://dx.doi.org/10.1038/s41598-022-16302-3 |
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author | Bhattacharya, Abhiroop Cloutier, Sylvain G. |
author_facet | Bhattacharya, Abhiroop Cloutier, Sylvain G. |
author_sort | Bhattacharya, Abhiroop |
collection | PubMed |
description | We report a complete deep-learning framework using a single-step object detection model in order to quickly and accurately detect and classify the types of manufacturing defects present on Printed Circuit Board (PCBs). We describe the complete model architecture and compare with the current state-of-the-art using the same PCB defect dataset. These benchmark methods include the Faster Region Based Convolutional Neural Network (FRCNN) with ResNet50, RetinaNet, and You-Only-Look-Once (YOLO) for defect detection and identification. Results show that our method achieves a 98.1% mean average precision(mAP[IoU = 0.5]) on the test samples using low-resolution images. This is 3.2% better than the state-of-the-art using low-resolution images (YOLO V5m) and 1.4% better than the state-of-the-art using high-resolution images (FRCNN-ResNet FPN). While achieving better accuracies, our model also requires roughly 3× fewer model parameters (7.02M) compared with the state-of-the-art FRCNN-ResNet FPN (23.59M) and YOLO V5m (20.08M). In most cases, the major bottleneck of the PCB manufacturing chain is quality control, reliability testing and manual rework of defective PCBs. Based on the initial results, we firmly believe that implementing this model on a PCB manufacturing line could significantly increase the production yield and throughput, while dramatically reducing manufacturing costs. |
format | Online Article Text |
id | pubmed-9307836 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2022 |
publisher | Nature Publishing Group UK |
record_format | MEDLINE/PubMed |
spelling | pubmed-93078362022-07-24 End-to-end deep learning framework for printed circuit board manufacturing defect classification Bhattacharya, Abhiroop Cloutier, Sylvain G. Sci Rep Article We report a complete deep-learning framework using a single-step object detection model in order to quickly and accurately detect and classify the types of manufacturing defects present on Printed Circuit Board (PCBs). We describe the complete model architecture and compare with the current state-of-the-art using the same PCB defect dataset. These benchmark methods include the Faster Region Based Convolutional Neural Network (FRCNN) with ResNet50, RetinaNet, and You-Only-Look-Once (YOLO) for defect detection and identification. Results show that our method achieves a 98.1% mean average precision(mAP[IoU = 0.5]) on the test samples using low-resolution images. This is 3.2% better than the state-of-the-art using low-resolution images (YOLO V5m) and 1.4% better than the state-of-the-art using high-resolution images (FRCNN-ResNet FPN). While achieving better accuracies, our model also requires roughly 3× fewer model parameters (7.02M) compared with the state-of-the-art FRCNN-ResNet FPN (23.59M) and YOLO V5m (20.08M). In most cases, the major bottleneck of the PCB manufacturing chain is quality control, reliability testing and manual rework of defective PCBs. Based on the initial results, we firmly believe that implementing this model on a PCB manufacturing line could significantly increase the production yield and throughput, while dramatically reducing manufacturing costs. Nature Publishing Group UK 2022-07-22 /pmc/articles/PMC9307836/ /pubmed/35869131 http://dx.doi.org/10.1038/s41598-022-16302-3 Text en © The Author(s) 2022 https://creativecommons.org/licenses/by/4.0/Open AccessThis article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. The images or other third party material in this article are included in the article's Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article's Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/ (https://creativecommons.org/licenses/by/4.0/) . |
spellingShingle | Article Bhattacharya, Abhiroop Cloutier, Sylvain G. End-to-end deep learning framework for printed circuit board manufacturing defect classification |
title | End-to-end deep learning framework for printed circuit board manufacturing defect classification |
title_full | End-to-end deep learning framework for printed circuit board manufacturing defect classification |
title_fullStr | End-to-end deep learning framework for printed circuit board manufacturing defect classification |
title_full_unstemmed | End-to-end deep learning framework for printed circuit board manufacturing defect classification |
title_short | End-to-end deep learning framework for printed circuit board manufacturing defect classification |
title_sort | end-to-end deep learning framework for printed circuit board manufacturing defect classification |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9307836/ https://www.ncbi.nlm.nih.gov/pubmed/35869131 http://dx.doi.org/10.1038/s41598-022-16302-3 |
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