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Affect of Secondary Beam Non-Uniformity on Plasma Potential Measurements by HIBD with Split-Plate Detector

In a Heavy Ion Beam Diagnostic (HIBD), the plasma potential is obtained by measuring the energy of the secondary ions resulting from beam-plasma collisions by an electrostatic energy analyzer with split-plate detector (SPD), which relates the secondary ion beam energy variation to its position deter...

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Detalles Bibliográficos
Autores principales: Nedzelskiy, Igor, Malaquias, Artur, Henriques, Rafael, Sharma, Ridhima
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9317691/
https://www.ncbi.nlm.nih.gov/pubmed/35890815
http://dx.doi.org/10.3390/s22145135
Descripción
Sumario:In a Heavy Ion Beam Diagnostic (HIBD), the plasma potential is obtained by measuring the energy of the secondary ions resulting from beam-plasma collisions by an electrostatic energy analyzer with split-plate detector (SPD), which relates the secondary ion beam energy variation to its position determined by the difference in currents between the split plates. Conventionally, the data from SPD are analyzed with the assumption that the secondary beam current is uniform. However, the secondary beam presents an effective projection of the primary beam, the current of which, as a rule, has a bell-like non-uniform profile. This paper presents: (i) the general features of the secondary beam profile formation, considered in the simplistic approximation of the circular primary beam and the secondary ions that emerge orthogonal to the primary beam axis, (ii) details of spit-plate detection and the influence of the secondary beam non-uniformity on plasma potential measurements, (iii) supported experimental data from the tokamak ISTTOK HIBD for primary and secondary beam profiles and the SPD transfer characteristic, obtained for the 90° cylindrical energy analyzer (90° CEA) and (iv) the implementation of a multiple cell array detector (MCAD) with dedicated resolution for the measurements of secondary beam profile and MCAD operation in multi-split-plate detection mode for direct measurements of the SPD transfer characteristic.